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Juergen Schloeffel
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Buchholz, DE
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Patents Grants
last 30 patents
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Patent Grant
Cell-aware fault model generation for delay faults
Patent number
8,990,760
Issue date
Mar 24, 2015
Mentor Graphics Corporation
Friedrich Hapke
G01 - MEASURING TESTING
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Patent Grant
On-chip logic to log failures during production testing and enable...
Patent number
8,423,845
Issue date
Apr 16, 2013
Mentor Graphics Corporation
Friedrich Hapke
G01 - MEASURING TESTING
Information
Patent Grant
Testable integrated circuit and test data generation method
Patent number
8,250,420
Issue date
Aug 21, 2012
NXP B.V.
Friedrich Hapke
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
On-Chip Logic To Log Failures During Production Testing And Enable...
Publication number
20110047425
Publication date
Feb 24, 2011
Friedrich Hapke
G01 - MEASURING TESTING
Information
Patent Application
Cell-Aware Fault Model Creation And Pattern Generation
Publication number
20100229061
Publication date
Sep 9, 2010
Friedrich HAPKE
G01 - MEASURING TESTING
Information
Patent Application
TESTABLE INTEGRATED CIRCUIT AND TEST DATA GENERATION METHOD
Publication number
20100117658
Publication date
May 13, 2010
NXP, B.V.
Friedrich Hapke
G01 - MEASURING TESTING