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Juergen Schneider
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Sinsheim, DE
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last 30 patents
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Patent Grant
Method and apparatus for investigating a sample with regard to the...
Patent number
9,274,057
Issue date
Mar 1, 2016
Leica Microsystems CMS GmbH
Juergen Schneider
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Method and Apparatus for Investigating a Sample with Regard to the...
Publication number
20150123013
Publication date
May 7, 2015
Leica Microsystems CMS GmbH
Juergen Schneider
G02 - OPTICS