Jui-Chun JAO

Person

Taoyuan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with fuse component
- Patent number 12,057,393
- Issue date Aug 6, 2024
- NANYA TECHNOLOGY CORPORATION
- Kai-Po Shang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a fuse component
- Patent number 12,002,752
- Issue date Jun 4, 2024
- NANYA TECHNOLOGY CORPORATION
- Kai-Po Shang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuse component, semiconductor device, and method for manufacturing...
- Patent number 11,916,015
- Issue date Feb 27, 2024
- NANYA TECHNOLOGY CORPORATION
- Kai-Po Shang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating a benchmark device on a semiconductor wafer wi...
- Patent number 11,876,024
- Issue date Jan 16, 2024
- NANYA TECHNOLOGY CORPORATION
- Yi-Ju Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for activating backup unit through fuse element
- Patent number 11,876,044
- Issue date Jan 16, 2024
- NANYA TECHNOLOGY CORPORATION
- Yi-Ju Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuse elements and semiconductor devices
- Patent number 11,843,030
- Issue date Dec 12, 2023
- NANYA TECHNOLOGY CORPORATION
- Yi-Ju Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe apparatus with a track
- Patent number 11,747,394
- Issue date Sep 5, 2023
- NANYA TECHNOLOGY CORPORATION
- Yi-Ju Chen
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure with test structure
- Patent number 11,699,624
- Issue date Jul 11, 2023
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device
- Patent number 11,677,137
- Issue date Jun 13, 2023
- Quanta Computer Inc.
- Wen-Yuan Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe apparatus having a track and wafer inspection method using th...
- Patent number 11,668,745
- Issue date Jun 6, 2023
- NANYA TECHNOLOGY CORPORATION
- Yi-Ju Chen
- G01 - MEASURING TESTING
Information Patent Grant
Memory test circuit and device wafer
- Patent number 11,557,360
- Issue date Jan 17, 2023
- NANYA TECHNOLOGY CORPORATION
- Yan-De Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device with bit line contact and method for fabricati...
- Patent number 11,521,976
- Issue date Dec 6, 2022
- NANYA TECHNOLOGY CORPORATION
- Yi-Ting Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing semiconductor device
- Patent number 11,521,901
- Issue date Dec 6, 2022
- NANYA TECHNOLOGY CORPORATION
- Chun-Shun Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure with test structure
- Patent number 11,456,224
- Issue date Sep 27, 2022
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with testing structure and method for fabricat...
- Patent number 11,417,574
- Issue date Aug 16, 2022
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antenna structure
- Patent number 11,329,382
- Issue date May 10, 2022
- Quanta Computer Inc.
- Wen-Yuan Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing fixture and testing assembly
- Patent number 11,262,398
- Issue date Mar 1, 2022
- NANYA TECHNOLOGY CORPORATION
- Ching-Chung Wang
- G01 - MEASURING TESTING
Information Patent Grant
Test array structure, wafer structure and wafer testing method
- Patent number 11,237,205
- Issue date Feb 1, 2022
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po Yang
- G01 - MEASURING TESTING
Information Patent Grant
Testing fixture and testing assembly
- Patent number 11,209,477
- Issue date Dec 28, 2021
- NANYA TECHNOLOGY CORPORATION
- Ching-Chung Wang
- G01 - MEASURING TESTING
Information Patent Grant
Testing structure and testing method
- Patent number 11,143,690
- Issue date Oct 12, 2021
- NANYA TECHNOLOGY CORPORATION
- Hsueh-Han Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mobile device
- Patent number 11,063,349
- Issue date Jul 13, 2021
- Quanta Computer Inc.
- Wen-Yuan Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and manufacturing method thereof
- Patent number 11,024,553
- Issue date Jun 1, 2021
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for preparing the same
- Patent number 10,985,077
- Issue date Apr 20, 2021
- NANYA TECHNOLOGY CORPORATION
- Chun-Shun Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holder
- Patent number 10,877,086
- Issue date Dec 29, 2020
- NANYA TECHNOLOGY CORPORATION
- Ching-Chung Wang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure and manufacturing method thereof
- Patent number 10,825,744
- Issue date Nov 3, 2020
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device
- Patent number 10,756,693
- Issue date Aug 25, 2020
- NANYA TECHNOLOGY CORPORATION
- Kai-Po Shang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anti-fuse structure
- Patent number 10,720,389
- Issue date Jul 21, 2020
- NANYA TECHNOLOGY CORPORATION
- Chih-Ying Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure
- Patent number 10,692,811
- Issue date Jun 23, 2020
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device and electrical testing method thereof
- Patent number 10,566,253
- Issue date Feb 18, 2020
- NANYA TECHNOLOGY CORPORATION
- Chih-Ying Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mobile device
- Patent number 10,542,130
- Issue date Jan 21, 2020
- QUANTA COMPUTER INC.
- Wen-Yuan Lo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
TEST ELEMENT GROUP FOR METAL ROUTING LAYER AND MANUFACTURING METHOD...
- Publication number 20240186194
- Publication date Jun 6, 2024
- NANYA TECHNOLOGY CORPORATION
- Chun Hua SHIH
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH PROGRAMMABLE FEATURE
- Publication number 20230389296
- Publication date Nov 30, 2023
- NANYA TECHNOLOGY CORPORATION
- YIN-FA CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH PROGRAMABLE FEATURE
- Publication number 20230389302
- Publication date Nov 30, 2023
- NANYA TECHNOLOGY CORPORATION
- YIN-FA CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR CHIP WITH PROGRAMMABLE FEATURE
- Publication number 20230389285
- Publication date Nov 30, 2023
- NANYA TECHNOLOGY CORPORATION
- YIN-FA CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING SEMICONDUCTOR DEVICE WITH PROGRAMMBLE FEATURE
- Publication number 20230389272
- Publication date Nov 30, 2023
- NANYA TECHNOLOGY CORPORATION
- YIN-FA CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ACTIVATING BACKUP UNIT
- Publication number 20230290725
- Publication date Sep 14, 2023
- NANYA TECHNOLOGY CORPORATION
- YI-JU CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE APPARATUS WITH A TRACK
- Publication number 20230288473
- Publication date Sep 14, 2023
- NANYA TECHNOLOGY CORPORATION
- YI-JU CHEN
- G01 - MEASURING TESTING
Information Patent Application
FUSE ELEMENTS AND SEMICONDUCTOR DEVICES
- Publication number 20230290819
- Publication date Sep 14, 2023
- NANYA TECHNOLOGY CORPORATION
- YI-JU CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
FUSE COMPONENT AND SEMICONDUCTOR DEVICE
- Publication number 20230178482
- Publication date Jun 8, 2023
- NANYA TECHNOLOGY CORPORATION
- KAI-PO SHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING A FUSE COMPONENT
- Publication number 20230178481
- Publication date Jun 8, 2023
- NANYA TECHNOLOGY CORPORATION
- KAI-PO SHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FUSE COMPONENT, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING...
- Publication number 20230125837
- Publication date Apr 27, 2023
- NANYA TECHNOLOGY CORPORATION
- KAI-PO SHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH FUSE COMPONENT
- Publication number 20230130975
- Publication date Apr 27, 2023
- NANYA TECHNOLOGY CORPORATION
- KAI-PO SHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A BENCHMARK DEVICE ON A SEMICONDUCTOR WAFER WI...
- Publication number 20230116846
- Publication date Apr 13, 2023
- NANYA TECHNOLOGY CORPORATION
- YI-JU CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BENCHMARK DEVICE ON A SEMICONDUCTOR WAFER WITH FUSE ELEMENT
- Publication number 20230116600
- Publication date Apr 13, 2023
- NANYA TECHNOLOGY CORPORATION
- YI-JU CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20230082822
- Publication date Mar 16, 2023
- QUANTA COMPUTER INC.
- Wen-Yuan LO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTING CIRCUIT AND METHOD FOR DETECTING MEMORY CHIP
- Publication number 20230071925
- Publication date Mar 9, 2023
- NANYA TECHNOLOGY CORPORATION
- Yan-De LIN
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE WITH TESTING STRUCTURE AND METHOD FOR FABRICAT...
- Publication number 20220139790
- Publication date May 5, 2022
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTENNA STRUCTURE
- Publication number 20220131268
- Publication date Apr 28, 2022
- QUANTA COMPUTER INC.
- Wen-Yuan LO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE
- Publication number 20220108929
- Publication date Apr 7, 2022
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE
- Publication number 20220051955
- Publication date Feb 17, 2022
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST ARRAY STRUCTURE, WAFER STRUCTURE AND WAFER TESTING METHOD
- Publication number 20210349145
- Publication date Nov 11, 2021
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po YANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREPARING SEMICONDUCTOR DEVICE
- Publication number 20210210391
- Publication date Jul 8, 2021
- NANYA TECHNOLOGY CORPORATION
- CHUN-SHUN HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING FIXTURE AND TESTING ASSEMBLY
- Publication number 20210132139
- Publication date May 6, 2021
- NANYA TECHNOLOGY CORPORATION
- Ching-Chung WANG
- G01 - MEASURING TESTING
Information Patent Application
TESTING FIXTURE AND TESTING ASSEMBLY
- Publication number 20210132138
- Publication date May 6, 2021
- NANYA TECHNOLOGY CORPORATION
- Ching-Chung WANG
- G01 - MEASURING TESTING
Information Patent Application
TESTING STRUCTURE AND TESTING METHOD
- Publication number 20210102990
- Publication date Apr 8, 2021
- NANYA TECHNOLOGY CORPORATION
- Hsueh-Han LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20210020527
- Publication date Jan 21, 2021
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOBILE DEVICE
- Publication number 20200243962
- Publication date Jul 30, 2020
- QUANTA COMPUTER INC.
- Wen-Yuan LO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLDER
- Publication number 20200182926
- Publication date Jun 11, 2020
- NANYA TECHNOLOGY CORPORATION
- Ching-Chung WANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE
- Publication number 20200176381
- Publication date Jun 4, 2020
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR PREPARING THE SAME
- Publication number 20200161191
- Publication date May 21, 2020
- NANYA TECHNOLOGY CORPORATION
- CHUN-SHUN HUANG
- H01 - BASIC ELECTRIC ELEMENTS

Jui-Chun JAO

Person

Patents Grantslast 30 patents

Semiconductor device with fuse component

Method for manufacturing a fuse component

Fuse component, semiconductor device, and method for manufacturing...

Method for operating a benchmark device on a semiconductor wafer wi...

Method for activating backup unit through fuse element

Fuse elements and semiconductor devices

Probe apparatus with a track

Semiconductor structure with test structure

Electronic device

Probe apparatus having a track and wafer inspection method using th...

Memory test circuit and device wafer

Semiconductor device with bit line contact and method for fabricati...

Method for preparing semiconductor device

Semiconductor structure with test structure

Semiconductor device with testing structure and method for fabricat...

Antenna structure

Testing fixture and testing assembly

Test array structure, wafer structure and wafer testing method

Testing fixture and testing assembly

Testing structure and testing method

Mobile device

Semiconductor structure and manufacturing method thereof

Semiconductor device and method for preparing the same

Holder

Semiconductor structure and manufacturing method thereof

Integrated circuit device

Anti-fuse structure

Semiconductor structure

Electronic device and electrical testing method thereof

Mobile device

Patents Applicationslast 30 patents

TEST ELEMENT GROUP FOR METAL ROUTING LAYER AND MANUFACTURING METHOD...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH PROGRAMMABLE FEATURE

SEMICONDUCTOR DEVICE WITH PROGRAMABLE FEATURE

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR CHIP WITH PROGRAMMABLE FEATURE

METHOD OF FABRICATING SEMICONDUCTOR DEVICE WITH PROGRAMMBLE FEATURE

METHOD FOR ACTIVATING BACKUP UNIT

PROBE APPARATUS WITH A TRACK

FUSE ELEMENTS AND SEMICONDUCTOR DEVICES

FUSE COMPONENT AND SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING A FUSE COMPONENT

FUSE COMPONENT, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING...

SEMICONDUCTOR DEVICE WITH FUSE COMPONENT

METHOD FOR OPERATING A BENCHMARK DEVICE ON A SEMICONDUCTOR WAFER WI...

BENCHMARK DEVICE ON A SEMICONDUCTOR WAFER WITH FUSE ELEMENT

ELECTRONIC DEVICE

DETECTING CIRCUIT AND METHOD FOR DETECTING MEMORY CHIP

SEMICONDUCTOR DEVICE WITH TESTING STRUCTURE AND METHOD FOR FABRICAT...

ANTENNA STRUCTURE

SEMICONDUCTOR STRUCTURE

SEMICONDUCTOR STRUCTURE

TEST ARRAY STRUCTURE, WAFER STRUCTURE AND WAFER TESTING METHOD

METHOD FOR PREPARING SEMICONDUCTOR DEVICE

TESTING FIXTURE AND TESTING ASSEMBLY

TESTING FIXTURE AND TESTING ASSEMBLY

TESTING STRUCTURE AND TESTING METHOD

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

MOBILE DEVICE

HOLDER

SEMICONDUCTOR STRUCTURE

SEMICONDUCTOR DEVICE AND METHOD FOR PREPARING THE SAME