Juichiro Ukon

Person

Minami-ku, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical analyzer and wavelength stabilized laser device for analyzer
- Patent number 9,116,116
- Issue date Aug 25, 2015
- Horiba, Ltd.
- Juichiro Ukon
- G01 - MEASURING TESTING
Information Patent Grant
Refined oil degradation level measuring instrument and refined oil...
- Patent number 8,704,174
- Issue date Apr 22, 2014
- Horiba, Ltd.
- Juichiro Ukon
- G01 - MEASURING TESTING
Information Patent Grant
Combustion furnace system for analyzing elements in a sample
- Patent number 6,627,155
- Issue date Sep 30, 2003
- Horiba, Ltd.
- Takeshi Uemura
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method for multi-component aqueous solutions and apparat...
- Patent number 5,886,347
- Issue date Mar 23, 1999
- Horiba, Ltd.
- Masaru Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining kinds of adsorbates
- Patent number 5,870,193
- Issue date Feb 9, 1999
- Nippon Soken, Inc.
- Atsuhiro Sumiya
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a peak position of a spectrum
- Patent number 5,745,369
- Issue date Apr 28, 1998
- Horiba Ltd.
- Juichiro Ukon
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-scanning mechanism and method for spectrometer
- Patent number 5,710,627
- Issue date Jan 20, 1998
- Horiba Ltd.
- Masaru Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Analytical system for remote transmission of data
- Patent number 5,521,845
- Issue date May 28, 1996
- Horiba, Ltd.
- Juichiro Ukon
- G08 - SIGNALLING
Information Patent Grant
Laser diffraction-type particle size distribution measuring method...
- Patent number 5,428,443
- Issue date Jun 27, 1995
- Horiba, Ltd.
- Hiroyuki Kitamura
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic spectrometer
- Patent number 5,301,007
- Issue date Apr 5, 1994
- Horiba Ltd.
- Juichiro Ukon
- G02 - OPTICS
Information Patent Grant
Infrared microscopic spectrometer
- Patent number 5,278,413
- Issue date Jan 11, 1994
- Horiba, Ltd.
- Tetsuji Yamaguchi
- G02 - OPTICS
Information Patent Grant
Microscopic spectrometer with auxiliary imaging system
- Patent number 5,241,362
- Issue date Aug 31, 1993
- Horiba Ltd.
- Juichiro Ukon
- G01 - MEASURING TESTING
Information Patent Grant
Infrared microscopic spectrometer using the attenuated total reflec...
- Patent number 5,229,611
- Issue date Jul 20, 1993
- Horiba, Ltd.
- Juichiro Ukon
- G02 - OPTICS
Information Patent Grant
Multibeam interferometer for use in a Fourier transform spectromete...
- Patent number 5,159,405
- Issue date Oct 27, 1992
- Horiba, Ltd.
- Juichiro Ukon
- G01 - MEASURING TESTING
Information Patent Grant
Reflective optical system for a microscopic spectrometer
- Patent number 5,136,422
- Issue date Aug 4, 1992
- Horiba, Ltd.
- Juichiro Ukon
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Substrate for Surface Enhanced Raman Scattering Spectroscopy and De...
- Publication number 20160109369
- Publication date Apr 21, 2016
- UKON CRAFT SCIENCE
- Juichiro Ukon
- G01 - MEASURING TESTING
Information Patent Application
DISCRIMINATION METHOD AND APPARATUS OF CARDIAC TISSUE USING RAMAN S...
- Publication number 20140340675
- Publication date Nov 20, 2014
- KYOTO PREFECTURAL PUBLIC UNIVERSITY CORPORATION
- Tetsuro Takamatsu
- G01 - MEASURING TESTING
Information Patent Application
MEASURING UNIT AND GAS ANALYZING APPARATUS
- Publication number 20140183380
- Publication date Jul 3, 2014
- HORIBA, LTD.
- Juichiro Ukon
- G01 - MEASURING TESTING
Information Patent Application
REFINED OIL DEGRADATION LEVEL MEASURING INSTRUMENT AND REFINED OIL...
- Publication number 20110155925
- Publication date Jun 30, 2011
- Juichiro Ukon
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ANALYZER AND WAVELENGTH STABILIZED LASER DEVICE FOR ANALYZER
- Publication number 20110019183
- Publication date Jan 27, 2011
- Horiba, Ltd.
- Juichiro Ukon
- G01 - MEASURING TESTING
Information Patent Application
Combustion furnace system for analyzing elements in a sample
- Publication number 20040247483
- Publication date Dec 9, 2004
- Takeshi Uemura
- G01 - MEASURING TESTING
Information Patent Application
Particle size distribution analyzer
- Publication number 20040227941
- Publication date Nov 18, 2004
- Tetsuji Yamaguchi
- G01 - MEASURING TESTING

Juichiro Ukon

Person

Patents Grantslast 30 patents

Optical analyzer and wavelength stabilized laser device for analyzer

Refined oil degradation level measuring instrument and refined oil...

Combustion furnace system for analyzing elements in a sample

Analytical method for multi-component aqueous solutions and apparat...

Apparatus for determining kinds of adsorbates

Method and apparatus for determining a peak position of a spectrum

Wavelength-scanning mechanism and method for spectrometer

Analytical system for remote transmission of data

Laser diffraction-type particle size distribution measuring method...

Microscopic spectrometer

Infrared microscopic spectrometer

Microscopic spectrometer with auxiliary imaging system

Infrared microscopic spectrometer using the attenuated total reflec...

Multibeam interferometer for use in a Fourier transform spectromete...

Reflective optical system for a microscopic spectrometer

Patents Applicationslast 30 patents

Substrate for Surface Enhanced Raman Scattering Spectroscopy and De...

DISCRIMINATION METHOD AND APPARATUS OF CARDIAC TISSUE USING RAMAN S...

MEASURING UNIT AND GAS ANALYZING APPARATUS

REFINED OIL DEGRADATION LEVEL MEASURING INSTRUMENT AND REFINED OIL...

OPTICAL ANALYZER AND WAVELENGTH STABILIZED LASER DEVICE FOR ANALYZER

Combustion furnace system for analyzing elements in a sample

Particle size distribution analyzer