Jukiya FUKUSHI

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Aomori, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measurement system and measurement method
- Patent number 11,971,296
- Issue date Apr 30, 2024
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe, optical probe array, optical probe card, and method...
- Patent number 11,971,431
- Issue date Apr 30, 2024
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe, optical probe array, test system and test method
- Patent number 11,624,679
- Issue date Apr 11, 2023
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL PROBE, PROBE CARD, MEASURING SYSTEM, AND MEASURING METHOD
- Publication number 20230038088
- Publication date Feb 9, 2023
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20220034714
- Publication date Feb 3, 2022
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROBE, OPTICAL PROBE ARRAY, OPTICAL PROBE CARD, AND METHOD...
- Publication number 20210364552
- Publication date Nov 25, 2021
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20210148835
- Publication date May 20, 2021
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROBE, OPTICAL PROBE ARRAY, TEST SYSTEM AND TEST METHOD
- Publication number 20210102864
- Publication date Apr 8, 2021
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- H01 - BASIC ELECTRIC ELEMENTS