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Jukiya FUKUSHI
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Aomori, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Measurement system
Patent number
12,031,921
Issue date
Jul 9, 2024
Kabushiki Kaisha Nihon Micronics
Michitaka Okuta
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system and measurement method
Patent number
11,971,296
Issue date
Apr 30, 2024
Kabushiki Kaisha Nihon Micronics
Michitaka Okuta
G01 - MEASURING TESTING
Information
Patent Grant
Optical probe, optical probe array, optical probe card, and method...
Patent number
11,971,431
Issue date
Apr 30, 2024
Kabushiki Kaisha Nihon Micronics
Michitaka Okuta
G01 - MEASURING TESTING
Information
Patent Grant
Optical probe, optical probe array, test system and test method
Patent number
11,624,679
Issue date
Apr 11, 2023
Kabushiki Kaisha Nihon Micronics
Michitaka Okuta
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL PROBE, PROBE CARD, MEASURING SYSTEM, AND MEASURING METHOD
Publication number
20230038088
Publication date
Feb 9, 2023
Kabushiki Kaisha Nihon Micronics
Michitaka OKUTA
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
Publication number
20220034714
Publication date
Feb 3, 2022
Kabushiki Kaisha Nihon Micronics
Michitaka OKUTA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PROBE, OPTICAL PROBE ARRAY, OPTICAL PROBE CARD, AND METHOD...
Publication number
20210364552
Publication date
Nov 25, 2021
Kabushiki Kaisha Nihon Micronics
Michitaka OKUTA
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM
Publication number
20210148835
Publication date
May 20, 2021
Kabushiki Kaisha Nihon Micronics
Michitaka OKUTA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PROBE, OPTICAL PROBE ARRAY, TEST SYSTEM AND TEST METHOD
Publication number
20210102864
Publication date
Apr 8, 2021
Kabushiki Kaisha Nihon Micronics
Michitaka OKUTA
H01 - BASIC ELECTRIC ELEMENTS