Julian Schwartz

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system to separate optically measured coupled parameters
- Patent number 11,404,728
- Issue date Aug 2, 2022
- Palo Alto Research Center Incorporated
- Anurag Ganguli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to separate optically measured coupled parameters
- Patent number 10,854,932
- Issue date Dec 1, 2020
- Palo Alto Research Center Incorporated
- Anurag Ganguli
- G01 - MEASURING TESTING
Information Patent Grant
Detection and/or prediction of plating events in an energy storage...
- Patent number 10,330,734
- Issue date Jun 25, 2019
- Palo Alto Research Center Incorporated
- Bhaskar Saha
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM TO SEPARATE OPTICALLY MEASURED COUPLED PARAMETERS
- Publication number 20210167427
- Publication date Jun 3, 2021
- Palo Alto Research Center Incorporated
- Anurag Ganguli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION AND/OR PREDICTION OF PLATING EVENTS IN AN ENERGY STORAGE...
- Publication number 20190025376
- Publication date Jan 24, 2019
- Palo Alto Research Center Incorporated
- Bhaskar Saha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM TO SEPARATE OPTICALLY MEASURED COUPLED PARAMETERS
- Publication number 20170033414
- Publication date Feb 2, 2017
- Palo Alto Research Center Incorporated
- Anurag Ganguli
- G01 - MEASURING TESTING