Julie A. Campbell

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Thermal management system for a test-and-measurement probe
- Patent number 12,332,277
- Issue date Jun 17, 2025
- Tektronix, Inc.
- Matthew J. Hull
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Securing a probe to a device under test
- Patent number 12,055,578
- Issue date Aug 6, 2024
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument accessory with reconfigurable proce...
- Patent number 11,815,548
- Issue date Nov 14, 2023
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Grant
Precision, high bandwidth, switching attenuator
- Patent number 11,808,786
- Issue date Nov 7, 2023
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Thermal management system for a test-and-measurement probe
- Patent number 11,578,925
- Issue date Feb 14, 2023
- Tektronix, Inc.
- Julie A. Campbell
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Encapsulated component attachment technique using a UV-cure conduct...
- Patent number 11,385,258
- Issue date Jul 12, 2022
- Tektronix, Inc.
- Julie A. Campbell
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Resistive test-probe tips
- Patent number 11,079,408
- Issue date Aug 3, 2021
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Position sensing in a probe to modify transfer characteristics in a...
- Patent number 10,962,566
- Issue date Mar 30, 2021
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Back-drilled via attachment technique using a UV-cure conductive ad...
- Patent number 10,859,598
- Issue date Dec 8, 2020
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Surface-mountable apparatus for coupling a test and measurement ins...
- Patent number 10,845,384
- Issue date Nov 24, 2020
- Tektronix Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Component attachment technique using a UV-cure conductive adhesive
- Patent number 10,739,381
- Issue date Aug 11, 2020
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip and probe assembly
- Patent number 10,241,133
- Issue date Mar 26, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G05 - CONTROLLING REGULATING
Information Patent Grant
Position sensing in a probe to modify transfer characteristics in a...
- Patent number 10,215,776
- Issue date Feb 26, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement probe with adjustable test point contact
- Patent number 10,168,356
- Issue date Jan 1, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
High impedance compliant probe tip
- Patent number 10,119,992
- Issue date Nov 6, 2018
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Grant
High impedance compliant probe tip
- Patent number 9,810,715
- Issue date Nov 7, 2017
- Tektronix, Inc.
- Julie A. Campbell
- G05 - CONTROLLING REGULATING
Information Patent Grant
Compensating probing tip optimized adapters for use with specific e...
- Patent number 9,404,940
- Issue date Aug 2, 2016
- Teledyne LeCroy, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Compensating resistance probing tip optimized adapters for use with...
- Patent number 9,140,724
- Issue date Sep 22, 2015
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Adherable holder and locater tool
- Patent number 8,786,299
- Issue date Jul 22, 2014
- Teledyne LeCroy, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Adherable holder and locater tool
- Patent number 8,421,488
- Issue date Apr 16, 2013
- Teledyne LeCroy, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Adherable holder and locater tool
- Patent number 8,134,377
- Issue date Mar 13, 2012
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Probing blade with conductive connector for use with an electrical...
- Patent number 8,098,078
- Issue date Jan 17, 2012
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Probing blade conductive connector for use with an electrical test...
- Patent number 7,671,613
- Issue date Mar 2, 2010
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Cap at resistors of electrical test probe
- Patent number 7,525,328
- Issue date Apr 28, 2009
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Bendable conductive connector
- Patent number 7,492,177
- Issue date Feb 17, 2009
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Modular active test probe and removable tip module therefor
- Patent number 7,432,698
- Issue date Oct 7, 2008
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Probing high-frequency signals
- Patent number 7,378,832
- Issue date May 27, 2008
- LeCroy Corporation
- Albert Sutono
- G01 - MEASURING TESTING
Information Patent Grant
Resistive test probe tips and applications therefor
- Patent number 7,321,234
- Issue date Jan 22, 2008
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Guide for tip to transmission path contact
- Patent number 7,317,312
- Issue date Jan 8, 2008
- LeCroy Corporation
- Jason Victor Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Cap at resistors of electrical test probe
- Patent number 7,295,020
- Issue date Nov 13, 2007
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CURRENT SHUNT USING WIRE BUNDLE CONSTRUCTION
- Publication number 20240310413
- Publication date Sep 19, 2024
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
HIGH-IMPEDANCE DIFFERENTIAL FLEXIBLE PROBE TIP
- Publication number 20240118314
- Publication date Apr 11, 2024
- Tektronix, Inc.
- Julie A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURRENT SHUNT WITH CANCELING MUTUAL INDUCTANCE
- Publication number 20240087776
- Publication date Mar 14, 2024
- Tektronix, Inc.
- Julie A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR
- Publication number 20240069065
- Publication date Feb 29, 2024
- Tektronix, Inc.
- JULIE A. CAMPBELL
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...
- Publication number 20240069094
- Publication date Feb 29, 2024
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Application
CURRENT MONITOR COMBINING A SHUNT RESISTOR WITH A ROGOWSKI COIL
- Publication number 20240061021
- Publication date Feb 22, 2024
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
SHUNT FOR USE IN BUSBAR-TO-MODULE CONNECTIONS
- Publication number 20230375596
- Publication date Nov 23, 2023
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
LAMINATED STRUCTURE FOR THERMAL CONDUCTION IN A FLEXIBLE ELECTRICAL...
- Publication number 20230221348
- Publication date Jul 13, 2023
- Tektronix, Inc.
- Julie A. Campbell
- B32 - LAYERED PRODUCTS
Information Patent Application
PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR
- Publication number 20220326278
- Publication date Oct 13, 2022
- Tektronix, Inc.
- JULIE A. CAMPBELL
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...
- Publication number 20220018896
- Publication date Jan 20, 2022
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Application
SECURING A PROBE TO A DEVICE UNDER TEST
- Publication number 20220011361
- Publication date Jan 13, 2022
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
THERMAL MANAGEMENT SYSTEM FOR A TEST-AND-MEASUREMENT PROBE
- Publication number 20210148640
- Publication date May 20, 2021
- Tektronix, Inc.
- Julie A. Campbell
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
ENCAPSULATED COMPONENT ATTACHMENT TECHNIQUE USING A UV-CURE CONDUCT...
- Publication number 20210018532
- Publication date Jan 21, 2021
- Tektronix, Inc.
- Julie A. Campbell
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
UV CURABLE CONDUCTIVE ADHESIVE
- Publication number 20200095480
- Publication date Mar 26, 2020
- Tektronix, Inc.
- Julie A. Campbell
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
SURFACE-MOUNTABLE APPARATUS FOR COUPLING A TEST AND MEASUREMENT INS...
- Publication number 20190353682
- Publication date Nov 21, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Resistive Test-Probe Tips
- Publication number 20190353683
- Publication date Nov 21, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT ATTACHMENT TECHNIQUE USING A UV-CURE CONDUCTIVE ADHESIVE
- Publication number 20180340956
- Publication date Nov 29, 2018
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
PROBE TIP AND PROBE ASSEMBLY
- Publication number 20180059139
- Publication date Mar 1, 2018
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Position Sensing in a Probe to Modify Transfer Characteristics in a...
- Publication number 20170115325
- Publication date Apr 27, 2017
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT PROBE WITH ADJUSTABLE TEST POINT CONTACT
- Publication number 20170052216
- Publication date Feb 23, 2017
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE COMPLIANT PROBE TIP
- Publication number 20160291054
- Publication date Oct 6, 2016
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE COMPLIANT PROBE TIP
- Publication number 20160187382
- Publication date Jun 30, 2016
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Probing high-frequency signals
- Publication number 20080048639
- Publication date Feb 28, 2008
- Albert Sutono
- G01 - MEASURING TESTING
Information Patent Application
Cap at resistors of electrical test probe
- Publication number 20070273360
- Publication date Nov 29, 2007
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Resistive test probe tips and applications therefor
- Publication number 20070229099
- Publication date Oct 4, 2007
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Cap at resistors of electrical test probe
- Publication number 20050168230
- Publication date Aug 4, 2005
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Resistive probe tips
- Publication number 20050134298
- Publication date Jun 23, 2005
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Cartridge system for a probing head for an electrical test probe
- Publication number 20050073291
- Publication date Apr 7, 2005
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Notched electrical test probe tip
- Publication number 20050052193
- Publication date Mar 10, 2005
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Cartridge system for a probing head for an electrical test probe
- Publication number 20040008046
- Publication date Jan 15, 2004
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING

Julie A. Campbell

Person

Patents Grantslast 30 patents

Thermal management system for a test-and-measurement probe

Securing a probe to a device under test

Test and measurement instrument accessory with reconfigurable proce...

Precision, high bandwidth, switching attenuator

Thermal management system for a test-and-measurement probe

Encapsulated component attachment technique using a UV-cure conduct...

Resistive test-probe tips

Position sensing in a probe to modify transfer characteristics in a...

Back-drilled via attachment technique using a UV-cure conductive ad...

Surface-mountable apparatus for coupling a test and measurement ins...

Component attachment technique using a UV-cure conductive adhesive

Probe tip and probe assembly

Position sensing in a probe to modify transfer characteristics in a...

Test and measurement probe with adjustable test point contact

High impedance compliant probe tip

High impedance compliant probe tip

Compensating probing tip optimized adapters for use with specific e...

Compensating resistance probing tip optimized adapters for use with...

Adherable holder and locater tool

Adherable holder and locater tool

Adherable holder and locater tool

Probing blade with conductive connector for use with an electrical...

Probing blade conductive connector for use with an electrical test...

Cap at resistors of electrical test probe

Bendable conductive connector

Modular active test probe and removable tip module therefor

Probing high-frequency signals

Resistive test probe tips and applications therefor

Guide for tip to transmission path contact

Cap at resistors of electrical test probe

Patents Applicationslast 30 patents

CURRENT SHUNT USING WIRE BUNDLE CONSTRUCTION

HIGH-IMPEDANCE DIFFERENTIAL FLEXIBLE PROBE TIP

CURRENT SHUNT WITH CANCELING MUTUAL INDUCTANCE

PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR

TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...

CURRENT MONITOR COMBINING A SHUNT RESISTOR WITH A ROGOWSKI COIL

SHUNT FOR USE IN BUSBAR-TO-MODULE CONNECTIONS

LAMINATED STRUCTURE FOR THERMAL CONDUCTION IN A FLEXIBLE ELECTRICAL...

PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR

TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...

SECURING A PROBE TO A DEVICE UNDER TEST

THERMAL MANAGEMENT SYSTEM FOR A TEST-AND-MEASUREMENT PROBE

ENCAPSULATED COMPONENT ATTACHMENT TECHNIQUE USING A UV-CURE CONDUCT...

UV CURABLE CONDUCTIVE ADHESIVE

SURFACE-MOUNTABLE APPARATUS FOR COUPLING A TEST AND MEASUREMENT INS...

Resistive Test-Probe Tips

COMPONENT ATTACHMENT TECHNIQUE USING A UV-CURE CONDUCTIVE ADHESIVE

PROBE TIP AND PROBE ASSEMBLY

Position Sensing in a Probe to Modify Transfer Characteristics in a...

TEST AND MEASUREMENT PROBE WITH ADJUSTABLE TEST POINT CONTACT

HIGH IMPEDANCE COMPLIANT PROBE TIP

HIGH IMPEDANCE COMPLIANT PROBE TIP

Probing high-frequency signals

Cap at resistors of electrical test probe

Resistive test probe tips and applications therefor

Cap at resistors of electrical test probe

Resistive probe tips

Cartridge system for a probing head for an electrical test probe

Notched electrical test probe tip

Cartridge system for a probing head for an electrical test probe