Julie L. Lee

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Wappingers Falls, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Identifying defects
- Patent number 8,571,299
- Issue date Oct 29, 2013
- International Business Machines Corporation
- Mohammed F. Fayaz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER-BASED DEFECT ROOT CAUSE AND YIELD IMPACT DETERMINATION IN...
- Publication number 20150204799
- Publication date Jul 23, 2015
- International Business Machines Corporation
- Benjamin R. Cipriany
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING DEFECTS
- Publication number 20120050728
- Publication date Mar 1, 2012
- International Business Machines Corporation
- Mohammed F. Fayaz
- G01 - MEASURING TESTING