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Julien Orlando
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Toulouse, FR
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Patents Grants
last 30 patents
Information
Patent Grant
Built in self test transmitter phase calibration
Patent number
11,656,330
Issue date
May 23, 2023
NXP USA, INC.
Olivier Vincent Doare
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Phase rotator control apparatus and method therefor
Patent number
11,652,470
Issue date
May 16, 2023
NXP USA, INC.
Dominique Delbecq
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Phase rotator calibration apparatus and method therefor
Patent number
11,496,122
Issue date
Nov 8, 2022
NXP USA, INC.
Dominique Delbecq
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Phase preset for fast chirp PLL
Patent number
11,131,763
Issue date
Sep 28, 2021
NXP USA, INC.
Jean-Stephane Vigier
G01 - MEASURING TESTING
Information
Patent Grant
Boosted return time for fast chirp PLL and calibration method
Patent number
11,131,762
Issue date
Sep 28, 2021
NXP USA, INC.
Jean-Stephane Vigier
G01 - MEASURING TESTING
Information
Patent Grant
Communication unit, integrated circuits and method for clock and da...
Patent number
11,054,513
Issue date
Jul 6, 2021
NXP USA, INC.
Olivier Doaré
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CASCADED RADAR SYSTEM WITH TRANSMITING-VEHICLE REFLECTION MITIGATION
Publication number
20240310474
Publication date
Sep 19, 2024
NXP B.V.
Cristian Pavao MORIERA
G01 - MEASURING TESTING
Information
Patent Application
TIME-CONTINUOUS POWER MONITORING FOR RADAR APPLICATIONS
Publication number
20240012107
Publication date
Jan 11, 2024
NXP B.V.
Yi YIN
G01 - MEASURING TESTING
Information
Patent Application
PHASE ROTATOR CALIBRATION APPARATUS AND METHOD THEREFOR
Publication number
20220021378
Publication date
Jan 20, 2022
NXP USA, Inc.
Dominique Delbecq
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PHASE ROTATOR CONTROL APPARATUS AND METHOD THEREFOR
Publication number
20210305969
Publication date
Sep 30, 2021
NXP USA, Inc.
Dominique Delbecq
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
BUILT IN SELF TEST TRANSMITTER PHASE CALIBRATION
Publication number
20200400783
Publication date
Dec 24, 2020
NXP USA, Inc.
Olivier Vincent Doare
G01 - MEASURING TESTING
Information
Patent Application
COMMUNICATION UNIT, INTEGRATED CIRCUITS AND METHOD FOR CLOCK AND DA...
Publication number
20200003862
Publication date
Jan 2, 2020
NXP USA, Inc.
Olivier Doaré
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMMUNICATION UNIT, INTEGRATED CIRCUITS AND METHOD FOR CLOCK AND DA...
Publication number
20200003883
Publication date
Jan 2, 2020
NXP USA, Inc.
Olivier Doaré
G01 - MEASURING TESTING
Information
Patent Application
PHASE PRESET FOR FAST CHIRP PLL
Publication number
20190377076
Publication date
Dec 12, 2019
NXP USA, Inc.
Jean-Stephane Vigier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
BOOSTED RETURN TIME FOR FAST CHIRP PLL AND CALIBRATION METHOD
Publication number
20190377078
Publication date
Dec 12, 2019
NXP USA, Inc.
Jean-Stephane Vigier
H03 - BASIC ELECTRONIC CIRCUITRY