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Julius J. Muray
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Los Altos, CA, US
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last 30 patents
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Patent Grant
Reregistration system for a charged particle beam exposure system
Patent number
4,385,238
Issue date
May 24, 1983
Veeco Instruments Incorporated
Eugene R. Westerberg
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Apparatus for measuring wheel alignment of motor vehicles
Patent number
4,249,824
Issue date
Feb 10, 1981
FMC Corporation
James L. Wiederrich
G01 - MEASURING TESTING