Jun Akedo

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical movement measuring method and apparatus using interference...
- Patent number 5,355,220
- Issue date Oct 11, 1994
- Ricoh Company, Ltd.
- Hiroshi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Moving amount detecting method using a shadow picture diffraction i...
- Patent number 5,148,019
- Issue date Sep 15, 1992
- Ricoh Company Ltd.
- Hiroshi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Rotation quantity measuring method and system
- Patent number 4,987,299
- Issue date Jan 22, 1991
- Ricoh Company, Ltd.
- Hiroshi Kobayashi
- G02 - OPTICS
Information Patent Grant
Method of manufacturing masked semiconductor laser
- Patent number 4,855,256
- Issue date Aug 8, 1989
- Ricoh Company, Ltd.
- Hiroshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing masked semiconductor laser
- Patent number 4,840,922
- Issue date Jun 20, 1989
- Ricoh Company, Ltd.
- Hiroshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern recognition device
- Patent number 4,841,129
- Issue date Jun 20, 1989
- Opticon Inc.
- Takao Tawara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring the amount of movement of an object having unif...
- Patent number 4,823,001
- Issue date Apr 18, 1989
- Ricoh Company, Ltd.
- Hiroshi Kobayashi
- G01 - MEASURING TESTING