Jun Amako

Person

Suwa-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample analysis element and detection device
- Patent number 9,228,944
- Issue date Jan 5, 2016
- Seiko Epson Corporation
- Mamoru Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis device, testing apparatus, and sensor cartridge
- Patent number 9,222,889
- Issue date Dec 29, 2015
- Seiko Epson Corporation
- Mamoru Sugimoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sensor chip, sensor cartridge, and analysis apparatus
- Patent number 9,151,666
- Issue date Oct 6, 2015
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Optical device with propagating and localized surface plasmons and...
- Patent number 9,057,697
- Issue date Jun 16, 2015
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive diffraction grating and detection apparatus
- Patent number 9,041,924
- Issue date May 26, 2015
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus
- Patent number 8,902,419
- Issue date Dec 2, 2014
- Seiko Epson Corporation
- Yusuke Sakagami
- G01 - MEASURING TESTING
Information Patent Grant
Optical device, analyzing apparatus and spectroscopic method
- Patent number 8,848,182
- Issue date Sep 30, 2014
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Optical device and detection device
- Patent number 8,836,946
- Issue date Sep 16, 2014
- Seiko Epson Corporation
- Jun Amako
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample analysis element and detecting device
- Patent number 8,836,947
- Issue date Sep 16, 2014
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis element and detecting device
- Patent number 8,817,263
- Issue date Aug 26, 2014
- Seiko Epson Corporation
- Mamoru Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Sensor chip, sensor cartridge, and analysis apparatus
- Patent number 8,710,427
- Issue date Apr 29, 2014
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry apparatus, detection apparatus, and method for manufac...
- Patent number 8,570,509
- Issue date Oct 29, 2013
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Optical device and analyzing apparatus
- Patent number 8,553,220
- Issue date Oct 8, 2013
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Microstructure manufacturing method
- Patent number 8,529,782
- Issue date Sep 10, 2013
- Seiko Epson Corporation
- Jun Amako
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Optical device unit and detection apparatus
- Patent number 8,531,661
- Issue date Sep 10, 2013
- Seiko Epson Corporation
- Yusuke Sakagami
- G01 - MEASURING TESTING
Information Patent Grant
Optical device unit and detection apparatus
- Patent number 8,497,987
- Issue date Jul 30, 2013
- Seiko Epson Corporation
- Yusuke Sakagami
- G01 - MEASURING TESTING
Information Patent Grant
Sensor chip, sensor cartridge, and analysis apparatus
- Patent number 8,415,611
- Issue date Apr 9, 2013
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing fine structure
- Patent number 8,221,963
- Issue date Jul 17, 2012
- Seiko Epson Corporation
- Jun Amako
- G02 - OPTICS
Information Patent Grant
Optical element having a diffractive layer and a relief pattern wit...
- Patent number 7,972,017
- Issue date Jul 5, 2011
- Seiko Epson Corporation
- Jun Amako
- G02 - OPTICS
Information Patent Grant
Liquid crystal device having a diffraction function layer that incl...
- Patent number 7,944,544
- Issue date May 17, 2011
- Seiko Epson Corporation
- Jun Amako
- B32 - LAYERED PRODUCTS
Information Patent Grant
Optical element, liquid crystal device, and display
- Patent number 7,885,004
- Issue date Feb 8, 2011
- Seiko Epson Corporation
- Jun Amako
- G02 - OPTICS
Information Patent Grant
Method for manufacturing a microstructure, exposure device, and ele...
- Patent number 7,867,692
- Issue date Jan 11, 2011
- Seiko Epson Corporation
- Jun Amako
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of manufacturing ink jet head and ink jet head
- Patent number 7,762,650
- Issue date Jul 27, 2010
- Seiko Epson Corporation
- Hirotsuna Miura
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Optical element, liquid crystal device, and display
- Patent number 7,755,718
- Issue date Jul 13, 2010
- Seiko Epson Corporation
- Jun Amako
- G02 - OPTICS
Information Patent Grant
Optical element having a reflected light diffusing function and a p...
- Patent number 7,722,194
- Issue date May 25, 2010
- Seiko Epson Corporation
- Jun Amako
- G02 - OPTICS
Information Patent Grant
Liquid drop discharge device, printer, printing method, and electro...
- Patent number 7,387,682
- Issue date Jun 17, 2008
- Seiko Epson Corporation
- Hirotsuna Miura
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Polarization control element, manufacturing method of polarization...
- Patent number 7,339,734
- Issue date Mar 4, 2008
- Seiko Epson Corporation
- Jun Amako
- G02 - OPTICS
Information Patent Grant
Substrate processing method, method of manufacturing micro lens she...
- Patent number 7,255,806
- Issue date Aug 14, 2007
- Seiko Epson Corporation
- Kazuto Yoshimura
- B44 - DECORATIVE ARTS
Information Patent Grant
Method and apparatus for cutting electrical wiring line on a substr...
- Patent number 7,241,967
- Issue date Jul 10, 2007
- Seiko Epson Corporation
- Kazushige Umetsu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of manufacturing ink jet head and ink jet head
- Patent number 7,169,537
- Issue date Jan 30, 2007
- Seiko Epson Corporation
- Hirotsuna Miura
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE ANALYSIS DEVICE, TESTING APPARATUS, AND SENSOR CARTRIDGE
- Publication number 20150138543
- Publication date May 21, 2015
- SEIKO EPSON CORPORATION
- Mamoru Sugimoto
- B82 - NANO-TECHNOLOGY
Information Patent Application
DETECTION APPARATUS
- Publication number 20150124258
- Publication date May 7, 2015
- SEIKO EPSON CORPORATION
- Jun Amako
- B82 - NANO-TECHNOLOGY
Information Patent Application
SAMPLE ANALYSIS ELEMENT AND DETECTION DEVICE
- Publication number 20150109619
- Publication date Apr 23, 2015
- SEIKO EPSON CORPORATION
- Mamoru Sugimoto
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS ELEMENT AND DETECTION DEVICE
- Publication number 20150103347
- Publication date Apr 16, 2015
- SEIKO EPSON CORPORATION
- Mamoru Sugimoto
- G01 - MEASURING TESTING
Information Patent Application
MICROSTRUCTURE MANUFACTURING METHOD
- Publication number 20130248489
- Publication date Sep 26, 2013
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G02 - OPTICS
Information Patent Application
SENSOR CHIP, SENSOR CARTRIDGE, AND ANALYSIS APPARATUS
- Publication number 20130229652
- Publication date Sep 5, 2013
- SEIKO EPSON CORPORATION
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE
- Publication number 20130182258
- Publication date Jul 18, 2013
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE
- Publication number 20130182257
- Publication date Jul 18, 2013
- SEIKO EPSON CORPORATION
- Mamoru SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND DETECTION APPARATUS
- Publication number 20130092823
- Publication date Apr 18, 2013
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE AND DETECTION DEVICE
- Publication number 20120327417
- Publication date Dec 27, 2012
- SEIKO EPSON CORPORATION
- Jun AMAKO
- B82 - NANO-TECHNOLOGY
Information Patent Application
TRANSMISSIVE DIFFRACTION GRATING AND DETECTION APPARATUS
- Publication number 20120327412
- Publication date Dec 27, 2012
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE UNIT AND DETECTION APPARATUS
- Publication number 20120062881
- Publication date Mar 15, 2012
- SEIKO EPSON CORPORATION
- Yusuke SAKAGAMI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE UNIT AND DETECTION APPARATUS
- Publication number 20120062882
- Publication date Mar 15, 2012
- SEIKO EPSON CORPORATION
- Yusuke SAKAGAMI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION APPARATUS
- Publication number 20120062884
- Publication date Mar 15, 2012
- SEIKO EPSON CORPORATION
- Yusuke SAKAGAMI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND ANALYZING APPARATUS
- Publication number 20110279817
- Publication date Nov 17, 2011
- SEIKO EPSON CORPORATION
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY APPARATUS, DETECTION APPARATUS, AND METHOD FOR MANUFAC...
- Publication number 20110279818
- Publication date Nov 17, 2011
- SEIKO EPSON CORPORATION
- Jun Amako
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE, ANALYZING APPARATUS AND SPECTROSCOPIC METHOD
- Publication number 20110267613
- Publication date Nov 3, 2011
- SEIKO EPSON CORPORATION
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Application
SENSOR CHIP, SENSOR CARTRIDGE, AND ANALYSIS APPARATUS
- Publication number 20110116088
- Publication date May 19, 2011
- SEIKO EPSON CORPORATION
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Application
SENSOR CHIP, SENSOR CARTRIDGE, AND ANALYSIS APPARATUS
- Publication number 20110114859
- Publication date May 19, 2011
- SEIKO EPSON CORPORATION
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT, LIQUID CRYSTAL DEVICE, AND DISPLAY
- Publication number 20100238555
- Publication date Sep 23, 2010
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G02 - OPTICS
Information Patent Application
OPTICAL ELEMENT HAVING A DIFFRACTIVE LAYER AND A RELIEF PATTERN WIT...
- Publication number 20100188747
- Publication date Jul 29, 2010
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G02 - OPTICS
Information Patent Application
DIFFRACTIVE OPTICAL ELEMENT, METHOD FOR MANUFACTURING DIFFRACTIVE O...
- Publication number 20100020400
- Publication date Jan 28, 2010
- SEIKO EPSON CORPORATION
- Jun AMAKO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD FOR PRODUCING FINE STRUCTURE
- Publication number 20090170038
- Publication date Jul 2, 2009
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G02 - OPTICS
Information Patent Application
OPTICAL ELEMENT, LIQUID CRYSTAL DEVICE, AND DISPLAY
- Publication number 20090040607
- Publication date Feb 12, 2009
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G02 - OPTICS
Information Patent Application
OPTICAL ELEMENT, LIQUID CRYSTAL DEVICE, ELECTRONIC APPARATUS, OPTIC...
- Publication number 20080304004
- Publication date Dec 11, 2008
- SEIKO EPSON CORPORATION
- Jun Amako
- G02 - OPTICS
Information Patent Application
OPTICAL ELEMENT AND PROJECTION DISPLAY DEVICE
- Publication number 20080304153
- Publication date Dec 11, 2008
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G02 - OPTICS
Information Patent Application
WIRING SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080274338
- Publication date Nov 6, 2008
- SEIKO EPSON CORPORATION
- Toshihiko KANEDA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Element substrate and method of manufacturing the same
- Publication number 20080173471
- Publication date Jul 24, 2008
- Seiko Epson Corporation
- Toshihiko Kaneda
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Plated substrate and method of manufacturing the same
- Publication number 20080081155
- Publication date Apr 3, 2008
- Seiko Epson Corporation
- Toshihiko Kaneda
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR MANUFACTURING MICROSTRUCTURE AND DEVICE MA...
- Publication number 20070177116
- Publication date Aug 2, 2007
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

Sample analysis element and detection device

Sample analysis device, testing apparatus, and sensor cartridge

Sensor chip, sensor cartridge, and analysis apparatus

Optical device with propagating and localized surface plasmons and...

Transmissive diffraction grating and detection apparatus

Detection apparatus

Optical device, analyzing apparatus and spectroscopic method

Optical device and detection device

Sample analysis element and detecting device

Sample analysis element and detecting device

Sensor chip, sensor cartridge, and analysis apparatus

Spectrometry apparatus, detection apparatus, and method for manufac...

Optical device and analyzing apparatus

Microstructure manufacturing method

Optical device unit and detection apparatus

Optical device unit and detection apparatus

Sensor chip, sensor cartridge, and analysis apparatus

Method for producing fine structure

Optical element having a diffractive layer and a relief pattern wit...

Liquid crystal device having a diffraction function layer that incl...

Optical element, liquid crystal device, and display

Method for manufacturing a microstructure, exposure device, and ele...

Method of manufacturing ink jet head and ink jet head

Optical element, liquid crystal device, and display

Optical element having a reflected light diffusing function and a p...

Liquid drop discharge device, printer, printing method, and electro...

Polarization control element, manufacturing method of polarization...

Substrate processing method, method of manufacturing micro lens she...

Method and apparatus for cutting electrical wiring line on a substr...

Method of manufacturing ink jet head and ink jet head

Patents Applicationslast 30 patents

SAMPLE ANALYSIS DEVICE, TESTING APPARATUS, AND SENSOR CARTRIDGE

DETECTION APPARATUS

SAMPLE ANALYSIS ELEMENT AND DETECTION DEVICE

SAMPLE ANALYSIS ELEMENT AND DETECTION DEVICE

MICROSTRUCTURE MANUFACTURING METHOD

SENSOR CHIP, SENSOR CARTRIDGE, AND ANALYSIS APPARATUS

SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE

SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE

OPTICAL DEVICE AND DETECTION APPARATUS

OPTICAL DEVICE AND DETECTION DEVICE

TRANSMISSIVE DIFFRACTION GRATING AND DETECTION APPARATUS

OPTICAL DEVICE UNIT AND DETECTION APPARATUS

OPTICAL DEVICE UNIT AND DETECTION APPARATUS

DETECTION APPARATUS

OPTICAL DEVICE AND ANALYZING APPARATUS

SPECTROMETRY APPARATUS, DETECTION APPARATUS, AND METHOD FOR MANUFAC...

OPTICAL DEVICE, ANALYZING APPARATUS AND SPECTROSCOPIC METHOD

SENSOR CHIP, SENSOR CARTRIDGE, AND ANALYSIS APPARATUS

SENSOR CHIP, SENSOR CARTRIDGE, AND ANALYSIS APPARATUS

OPTICAL ELEMENT, LIQUID CRYSTAL DEVICE, AND DISPLAY

OPTICAL ELEMENT HAVING A DIFFRACTIVE LAYER AND A RELIEF PATTERN WIT...

DIFFRACTIVE OPTICAL ELEMENT, METHOD FOR MANUFACTURING DIFFRACTIVE O...

METHOD FOR PRODUCING FINE STRUCTURE

OPTICAL ELEMENT, LIQUID CRYSTAL DEVICE, AND DISPLAY

OPTICAL ELEMENT, LIQUID CRYSTAL DEVICE, ELECTRONIC APPARATUS, OPTIC...

OPTICAL ELEMENT AND PROJECTION DISPLAY DEVICE

WIRING SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME

Element substrate and method of manufacturing the same

Plated substrate and method of manufacturing the same

METHOD AND APPARATUS FOR MANUFACTURING MICROSTRUCTURE AND DEVICE MA...