Jun CHEN

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Model calibration and guided metrology based on smart sampling
- Patent number 11,630,396
- Issue date Apr 18, 2023
- ASML Netherlands B.V.
- Jun Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display controller, display control method, and display control sys...
- Patent number 11,600,243
- Issue date Mar 7, 2023
- VeriSilicon Microelectronics (Shanghai) Co., Ltd.
- Lefan Zhong
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Gauge pattern selection
- Patent number 10,663,870
- Issue date May 26, 2020
- ASML Netherlands B.V.
- Jun Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR IMPROVING PROCESS BASED CONTOUR INFORMATION OF STRUCTUR...
- Publication number 20220299881
- Publication date Sep 22, 2022
- ASML NETHERLANDS B.V.
- Yunan ZHENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DISPLAY CONTROLLER, DISPLAY CONTROL METHOD, AND DISPLAY CONTROL SYS...
- Publication number 20220051640
- Publication date Feb 17, 2022
- VeriSilicon Holdings Co., Ltd.
- Lefan ZHONG
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
MODEL CALIBRATION AND GUIDED METROLOGY BASED ON SMART SAMPLING
- Publication number 20210263428
- Publication date Aug 26, 2021
- ASML NETHERLANDS B.V.
- Jun CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVEMENTS IN GAUGE PATTERN SELECTION
- Publication number 20180364589
- Publication date Dec 20, 2018
- ASML NETHERLANDS B.V.
- Jun CHEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY