Jun-Cheng Lai

Person

Hsin-Chu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit board for semiconductor test
- Patent number 11,852,679
- Issue date Dec 26, 2023
- MPI Corporation
- Shih-Ching Chen
- G01 - MEASURING TESTING
Information Patent Grant
Probe module supporting loopback test
- Patent number 10,295,567
- Issue date May 21, 2019
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer circuit board
- Patent number 10,070,512
- Issue date Sep 4, 2018
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe card capable of transmitting high-frequency signals
- Patent number 10,067,163
- Issue date Sep 4, 2018
- MPI CORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever type probe card for high frequency signal transmission
- Patent number 9,835,651
- Issue date Dec 5, 2017
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe card capable of transmitting high-frequency signals
- Patent number 9,658,249
- Issue date May 23, 2017
- MPI CORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer circuit board
- Patent number 9,622,348
- Issue date Apr 11, 2017
- MPI Corporation
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multilayer circuit board
- Patent number 9,596,769
- Issue date Mar 14, 2017
- MPI Corporation
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multilayer circuit board
- Patent number 9,545,002
- Issue date Jan 10, 2017
- MPI Corporation
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of detecting photolithographic hotspots
- Patent number 9,508,138
- Issue date Nov 29, 2016
- Powerchip Technology Corporation
- Yi-Shiang Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe module supporting loopback test
- Patent number 9,500,675
- Issue date Nov 22, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Signal path switch and probe card having the signal path switch
- Patent number 9,442,134
- Issue date Sep 13, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe card of low power loss
- Patent number 9,316,685
- Issue date Apr 19, 2016
- MPI CORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 8,542,027
- Issue date Sep 24, 2013
- MPI Corporation
- Young-Huang Chou
- G01 - MEASURING TESTING
Information Patent Grant
Probing device
- Patent number 7,782,070
- Issue date Aug 24, 2010
- MJC Probe Incorporated
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Half-tone phase shift mask and patterning method using thereof
- Patent number 7,461,472
- Issue date Dec 9, 2008
- Powerchip Semiconductor Corp.
- Jun-Cheng Lai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of improving a resolution of contact hole patterns by utiliz...
- Patent number 7,008,733
- Issue date Mar 7, 2006
- Powerchip Semiconductor Corp.
- Jun-Cheng Lai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for automatically determining adjustments for stepping photo...
- Patent number 6,200,708
- Issue date Mar 13, 2001
- Worldwide Semiconductor Manufacturing Corporation
- Jun-Cheng Lai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of multi-exposure for improving photolithography resolution
- Patent number 6,187,486
- Issue date Feb 13, 2001
- Worldwide Semiconductor Manufacturing Corp.
- Jun-Cheng Lai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DESIGN METHOD OF PHOTOMASK STRUCTURE
- Publication number 20240337920
- Publication date Oct 10, 2024
- Powerchip Semiconductor Manufacturing Corporation
- Kuei Yu Chien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CIRCUIT BOARD FOR SEMICONDUCTOR TESTING AND METHOD OF MANUFACTURING...
- Publication number 20240264219
- Publication date Aug 8, 2024
- MPI Corporation
- SHIH-CHING CHEN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CIRCUIT BOARD FOR SEMICONDUCTOR TEST
- Publication number 20220334178
- Publication date Oct 20, 2022
- MPI Corporation
- SHIH-CHING CHEN
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20170150592
- Publication date May 25, 2017
- MPI Corporation
- WEI-CHENG KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE CARD CAPABLE OF TRANSMITTING HIGH-FREQUENCY SIGNALS
- Publication number 20170059613
- Publication date Mar 2, 2017
- MPI Corporation
- Wei-Cheng KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE SUPPORTING LOOPBACK TEST
- Publication number 20170003319
- Publication date Jan 5, 2017
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING PHOTOLITHOGRAPHIC HOTSPOTS
- Publication number 20160321793
- Publication date Nov 3, 2016
- POWERCHIP TECHNOLOGY CORPORATION
- Yi-Shiang Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Probe Card
- Publication number 20160305981
- Publication date Oct 20, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY CANTILEVER TYPE PROBE CARD
- Publication number 20160139179
- Publication date May 19, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20160143141
- Publication date May 19, 2016
- MPI CORPORATION
- WEI-CHENG KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20160128176
- Publication date May 5, 2016
- MPI CORPORATION
- WEI-CHENG KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...
- Publication number 20160018441
- Publication date Jan 21, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...
- Publication number 20160018439
- Publication date Jan 21, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20150014046
- Publication date Jan 15, 2015
- MPI CORPORATION
- Wei-Cheng KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE MODULE SUPPORTING LOOPBACK TEST
- Publication number 20150015290
- Publication date Jan 15, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD FOR HIGH-FREQUENCY SIGNAL TRANSMISSION
- Publication number 20150015291
- Publication date Jan 15, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PATH SWITCH AND PROBE CARD HAVING THE SIGNAL PATH SWITCH
- Publication number 20150015295
- Publication date Jan 15, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
Probe card of low power loss
- Publication number 20140232421
- Publication date Aug 21, 2014
- MPI Corporation
- Wei-Cheng KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD CAPABLE OF TRANSMITTING HIGH-FREQUENCY SIGNALS
- Publication number 20140176177
- Publication date Jun 26, 2014
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20100237886
- Publication date Sep 23, 2010
- MPI CORPORATION
- Young Huang Chou
- G01 - MEASURING TESTING
Information Patent Application
PROBING DEVICE
- Publication number 20090009198
- Publication date Jan 8, 2009
- MJC Probe Incorporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IMPROVING A RESOLUTION OF CONTACT HOLE PATTERNS BY UTILIZ...
- Publication number 20050069781
- Publication date Mar 31, 2005
- Jun-Cheng Lai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
[HALF-TONE PHASE SHIFT MASK AND PATTERNING METHOD USING THEREOF]
- Publication number 20040253522
- Publication date Dec 16, 2004
- JUN-CHENG LAI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Jun-Cheng Lai

Person

Patents Grantslast 30 patents

Circuit board for semiconductor test

Probe module supporting loopback test

Multilayer circuit board

Probe card capable of transmitting high-frequency signals

Cantilever type probe card for high frequency signal transmission

Probe card capable of transmitting high-frequency signals

Multilayer circuit board

Multilayer circuit board

Multilayer circuit board

Method of detecting photolithographic hotspots

Probe module supporting loopback test

Signal path switch and probe card having the signal path switch

Probe card of low power loss

Probe card

Probing device

Half-tone phase shift mask and patterning method using thereof

Method of improving a resolution of contact hole patterns by utiliz...

Method for automatically determining adjustments for stepping photo...

Method of multi-exposure for improving photolithography resolution

Patents Applicationslast 30 patents

DESIGN METHOD OF PHOTOMASK STRUCTURE

CIRCUIT BOARD FOR SEMICONDUCTOR TESTING AND METHOD OF MANUFACTURING...

CIRCUIT BOARD FOR SEMICONDUCTOR TEST

MULTILAYER CIRCUIT BOARD

PROBE CARD CAPABLE OF TRANSMITTING HIGH-FREQUENCY SIGNALS

PROBE MODULE SUPPORTING LOOPBACK TEST

METHOD OF DETECTING PHOTOLITHOGRAPHIC HOTSPOTS

Probe Card

HIGH-FREQUENCY CANTILEVER TYPE PROBE CARD

MULTILAYER CIRCUIT BOARD

MULTILAYER CIRCUIT BOARD

PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...

PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...

MULTILAYER CIRCUIT BOARD

PROBE MODULE SUPPORTING LOOPBACK TEST

CANTILEVER PROBE CARD FOR HIGH-FREQUENCY SIGNAL TRANSMISSION

SIGNAL PATH SWITCH AND PROBE CARD HAVING THE SIGNAL PATH SWITCH

Probe card of low power loss

PROBE CARD CAPABLE OF TRANSMITTING HIGH-FREQUENCY SIGNALS

PROBE CARD

PROBING DEVICE

METHOD OF IMPROVING A RESOLUTION OF CONTACT HOLE PATTERNS BY UTILIZ...

[HALF-TONE PHASE SHIFT MASK AND PATTERNING METHOD USING THEREOF]