Jun Fujihara

Person

Nirasaki City, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,761,704
- Issue date Sep 19, 2023
- Tokyo Electron Limited
- Jun Fujihara
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Insertion/extraction mechanism and method for replacing block member
- Patent number 11,525,859
- Issue date Dec 13, 2022
- Tokyo Electron Limited
- Hiroaki Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact release method in inspection apparatus and inspection appar...
- Patent number 11,467,208
- Issue date Oct 11, 2022
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Testing system
- Patent number 11,454,664
- Issue date Sep 27, 2022
- Tokyo Electron Limited
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 11,442,096
- Issue date Sep 13, 2022
- Tokyo Electron Limited
- Kentaro Konishi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Chuck top, inspection apparatus, and chuck top recovery method
- Patent number 11,385,283
- Issue date Jul 12, 2022
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system
- Patent number 11,360,115
- Issue date Jun 14, 2022
- Tokyo Electron Limited
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and method of controlling temperature of probe card
- Patent number 11,307,223
- Issue date Apr 19, 2022
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method for inspecting electrica...
- Patent number 11,269,004
- Issue date Mar 8, 2022
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Prober and method of preheating probe card
- Patent number 11,249,132
- Issue date Feb 15, 2022
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Prober and probe card cleaning method
- Patent number 11,215,640
- Issue date Jan 4, 2022
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Prober and probe card precooling method
- Patent number 11,199,575
- Issue date Dec 14, 2021
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, inspection system, and aligning method
- Patent number 11,169,206
- Issue date Nov 9, 2021
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and contact method
- Patent number 11,099,236
- Issue date Aug 24, 2021
- Tokyo Electron Limited
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,092,641
- Issue date Aug 17, 2021
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system
- Patent number 11,067,624
- Issue date Jul 20, 2021
- Tokyo Electron Limited
- Kentaro Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intermediate connection member and inspection apparatus
- Patent number 10,935,570
- Issue date Mar 2, 2021
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection method and substrate inspection device
- Patent number 10,901,028
- Issue date Jan 26, 2021
- Tokyo Electron Limited
- Hiroshi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection device
- Patent number 10,845,409
- Issue date Nov 24, 2020
- Tokyo Electron Limited
- Hiroshi Yamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM
- Publication number 20240044807
- Publication date Feb 8, 2024
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- G01 - MEASURING TESTING
Information Patent Application
CONTACT RELEASE METHOD IN INSPECTION APPARATUS AND INSPECTION APPAR...
- Publication number 20210396803
- Publication date Dec 23, 2021
- TOKYO ELECTRON LIMITED
- Jun FUJIHARA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20210372695
- Publication date Dec 2, 2021
- TOKYO ELECTRON LIMITED
- Jun FUJIHARA
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
TESTING SYSTEM
- Publication number 20210333319
- Publication date Oct 28, 2021
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS
- Publication number 20210255233
- Publication date Aug 19, 2021
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G01 - MEASURING TESTING
Information Patent Application
PROBER AND PROBE CARD CLEANING METHOD
- Publication number 20210063443
- Publication date Mar 4, 2021
- TOKYO ELECTRON LIMITED
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Application
PROBER AND PROBE CARD PRECOOLING METHOD
- Publication number 20210048475
- Publication date Feb 18, 2021
- TOKYO ELECTRON LIMITED
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Application
PROBER AND METHOD OF PREHEATING PROBE CARD
- Publication number 20200408835
- Publication date Dec 31, 2020
- TOKYO ELECTRON LIMITED
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND METHOD OF CONTROLLING TEMPERATURE OF PROBE CARD
- Publication number 20200341031
- Publication date Oct 29, 2020
- TOKYO ELECTRON LIMITED
- Jun FUJIHARA
- G01 - MEASURING TESTING
Information Patent Application
CHUCK TOP, INSPECTION APPARATUS, AND CHUCK TOP RECOVERY METHOD
- Publication number 20200225282
- Publication date Jul 16, 2020
- TOKYO ELECTRON LIMITED
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20200158775
- Publication date May 21, 2020
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Application
INSERTION/EXTRACTION MECHANISM AND METHOD FOR REPLACING BLOCK MEMBER
- Publication number 20200153189
- Publication date May 14, 2020
- TOKYO ELECTRON LIMITED
- Hiroaki SAKAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM, AND ALIGNING METHOD
- Publication number 20200096560
- Publication date Mar 26, 2020
- Jun FUJIHARA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20200096561
- Publication date Mar 26, 2020
- TOKYO ELECTRON LIMITED
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20200096557
- Publication date Mar 26, 2020
- TOKYO ELECTRON LIMITED
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE AND CONTACT METHOD
- Publication number 20200033404
- Publication date Jan 30, 2020
- Takanori HYAKUDOMI
- G01 - MEASURING TESTING
Information Patent Application
Intermediate Connection Member and Inspection Apparatus
- Publication number 20200018778
- Publication date Jan 16, 2020
- TOKYO ELECTRON LIMITED
- Jun FUJIHARA
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE
- Publication number 20190331731
- Publication date Oct 31, 2019
- TOKYO ELECTRON LIMITED
- Hiroshi Yamada
- G01 - MEASURING TESTING
Information Patent Application
Substrate Inspection Method and Substrate Inspection Device
- Publication number 20190271738
- Publication date Sep 5, 2019
- TOKYO ELECTRON LIMITED
- Hiroshi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20190265272
- Publication date Aug 29, 2019
- TOKYO ELECTRON LIMITED
- Takanori Hyakudomi
- G01 - MEASURING TESTING

Jun Fujihara

Person

Patents Grantslast 30 patents

Inspection apparatus and inspection method

Insertion/extraction mechanism and method for replacing block member

Contact release method in inspection apparatus and inspection appar...

Testing system

Testing apparatus

Chuck top, inspection apparatus, and chuck top recovery method

Inspection system

Inspection device and method of controlling temperature of probe card

Inspection apparatus and inspection method for inspecting electrica...

Prober and method of preheating probe card

Prober and probe card cleaning method

Prober and probe card precooling method

Inspection apparatus, inspection system, and aligning method

Inspection device and contact method

Inspection apparatus and inspection method

Inspection system

Intermediate connection member and inspection apparatus

Substrate inspection method and substrate inspection device

Substrate inspection device

Patents Applicationslast 30 patents

INSPECTION SYSTEM

CONTACT RELEASE METHOD IN INSPECTION APPARATUS AND INSPECTION APPAR...

INSPECTION APPARATUS AND INSPECTION METHOD

TESTING SYSTEM

TESTING APPARATUS

PROBER AND PROBE CARD CLEANING METHOD

PROBER AND PROBE CARD PRECOOLING METHOD

PROBER AND METHOD OF PREHEATING PROBE CARD

INSPECTION DEVICE AND METHOD OF CONTROLLING TEMPERATURE OF PROBE CARD

CHUCK TOP, INSPECTION APPARATUS, AND CHUCK TOP RECOVERY METHOD

INSPECTION SYSTEM

INSERTION/EXTRACTION MECHANISM AND METHOD FOR REPLACING BLOCK MEMBER

INSPECTION APPARATUS, INSPECTION SYSTEM, AND ALIGNING METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

DETECTION DEVICE AND CONTACT METHOD

Intermediate Connection Member and Inspection Apparatus

SUBSTRATE INSPECTION DEVICE

Substrate Inspection Method and Substrate Inspection Device

INSPECTION SYSTEM