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Jun Gyo Bak
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Yuseong-gu, KR
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last 30 patents
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Patent Grant
Simultaneous measurement of the reflectivity of X-ray with differen...
Patent number
7,209,542
Issue date
Apr 24, 2007
Korea Basic Science Institute
Sang Gon Lee
G01 - MEASURING TESTING
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Patent Grant
X-ray tube
Patent number
6,408,053
Issue date
Jun 18, 2002
Korea Basic Science Institute
Sang Gon Lee
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Simultaneous measurement of the reflectivity of X-ray with differen...
Publication number
20060126786
Publication date
Jun 15, 2006
Sang Gon Lee
G01 - MEASURING TESTING