Jun Hirota

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor measurement device and method of measuring semiconductor
- Patent number 11,060,990
- Issue date Jul 13, 2021
- TOSHIBA MEMORY CORPORATION
- Jun Hirota
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method of scanning probe microscopy using penetrative pre...
- Patent number 10,545,170
- Issue date Jan 28, 2020
- TOSHIBA MEMORY CORPORATION
- Jun Hirota
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measurement method using the same
- Patent number 10,345,336
- Issue date Jul 9, 2019
- TOSHIBA MEMORY CORPORATION
- Jun Hirota
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 9,410,983
- Issue date Aug 9, 2016
- Kabushiki Kaisha Toshiba
- Hideo Shinomiya
- G01 - MEASURING TESTING
Information Patent Grant
Nonvolatile memory device
- Patent number 8,664,631
- Issue date Mar 4, 2014
- Kabushiki Kaisha Toshiba
- Jun Hirota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 8,558,354
- Issue date Oct 15, 2013
- Kabushiki Kaisha Toshiba
- Yoko Iwakaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device and method for manufacturing same
- Patent number 8,436,331
- Issue date May 7, 2013
- Kabushiki Kaisha Toshiba
- Yoko Iwakaji
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and method of manufacturing same
- Patent number 8,309,958
- Issue date Nov 13, 2012
- Kabushiki Kaisha Toshiba
- Jun Hirota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device
- Patent number 8,084,830
- Issue date Dec 27, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Kanno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with two barrier layers formed between copper-...
- Patent number 7,759,796
- Issue date Jul 20, 2010
- Kabushiki Kaisha Toshiba
- Jun Hirota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device
- Patent number 7,521,352
- Issue date Apr 21, 2009
- Kabushiki Kaisha Toshiba
- Hideo Shinomiya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE AND METHOD OF MEASURING SEMICONDUCTOR
- Publication number 20190293586
- Publication date Sep 26, 2019
- Toshiba Memory Corporation
- Jun HIROTA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD USING THE SAME
- Publication number 20170269123
- Publication date Sep 21, 2017
- Kabushiki Kaisha Toshiba
- Jun HIROTA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING METHOD OF SCANNING PROBE MICROSCOPY
- Publication number 20160377651
- Publication date Dec 29, 2016
- Kabushiki Kaisha Toshiba
- Jun HIROTA
- G01 - MEASURING TESTING
Information Patent Application
STORAGE DEVICE
- Publication number 20160379709
- Publication date Dec 29, 2016
- Kabushiki Kaisha Toshiba
- Jun HIROTA
- G11 - INFORMATION STORAGE
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20150059025
- Publication date Feb 26, 2015
- Kabushiki Kaisha Toshiba
- Hideo SHINOMIYA
- G01 - MEASURING TESTING
Information Patent Application
STORAGE DEVICE
- Publication number 20130077461
- Publication date Mar 28, 2013
- Akihiro Koga
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY DEVICE
- Publication number 20120235107
- Publication date Sep 20, 2012
- Kabushiki Kaisha Toshiba
- Jun HIROTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20120091414
- Publication date Apr 19, 2012
- Kabushiki Kaisha Toshiba
- Yoko IWAKAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20110233506
- Publication date Sep 29, 2011
- Kabushiki Kaisha Toshiba
- Yoko IWAKAJI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING SAME
- Publication number 20110227025
- Publication date Sep 22, 2011
- Kabushiki Kaisha Toshiba
- Jun HIROTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20110193049
- Publication date Aug 11, 2011
- Kabushiki Kaisha Toshiba
- Yoko IWAKAJI
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
- Publication number 20100213550
- Publication date Aug 26, 2010
- Kabushiki Kaisha Toshiba
- Hiroshi Kanno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20080296769
- Publication date Dec 4, 2008
- Jun HIROTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing a semiconductor device
- Publication number 20070254474
- Publication date Nov 1, 2007
- Hideo Shinomiya
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20070210406
- Publication date Sep 13, 2007
- Jun Hirota
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Semiconductor measurement device and method of measuring semiconductor

Measuring method of scanning probe microscopy using penetrative pre...

Scanning probe microscope and measurement method using the same

Scanning probe microscope

Nonvolatile memory device

Semiconductor device and method for manufacturing the same

Memory device and method for manufacturing same

Semiconductor memory device and method of manufacturing same

Nonvolatile semiconductor memory device

Semiconductor device with two barrier layers formed between copper-...

Method for manufacturing a semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR MEASUREMENT DEVICE AND METHOD OF MEASURING SEMICONDUCTOR

SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD USING THE SAME

MEASURING METHOD OF SCANNING PROBE MICROSCOPY

STORAGE DEVICE

SCANNING PROBE MICROSCOPE

STORAGE DEVICE

NONVOLATILE MEMORY DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

NONVOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING SAME

MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Method for manufacturing a semiconductor device

Semiconductor device and method of manufacturing the same