Jun Inagaki

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Himeji-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample measuring apparatus and sample measuring method
- Patent number 11,422,143
- Issue date Aug 23, 2022
- Sysmex Corporation
- Takashi Yamato
- G01 - MEASURING TESTING
Information Patent Grant
Sample aspirating apparatus and sample analyzer
- Patent number 8,580,210
- Issue date Nov 12, 2013
- Sysmex Corporation
- Hironori Katsumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD
- Publication number 20190265264
- Publication date Aug 29, 2019
- SYSMEX CORPORATION
- Takashi YAMATO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ASPIRATING APPARATUS AND SAMPLE ANALYZER
- Publication number 20120045366
- Publication date Feb 23, 2012
- SYSMEX CORPORATION
- Hironori KATSUMI
- G01 - MEASURING TESTING