Jun Kawakami

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Mito-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Reticle, reticle unit, rifle scope, and optical apparatus
- Patent number 11,119,330
- Issue date Sep 14, 2021
- Nikon Corporation
- Koichi Watanabe
- F41 - WEAPONS
Information Patent Grant
Method and apparatus for point diffraction interferometry
- Patent number 6,963,408
- Issue date Nov 8, 2005
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring interference and apparatus for measuring inter...
- Patent number 6,940,605
- Issue date Sep 6, 2005
- Nikon Corporation
- Jun Kawakami
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring refractive index of medium using light, dis...
- Patent number 5,767,971
- Issue date Jun 16, 1998
- Nikon Corporation
- Hitoshi Kawai
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric apparatus for measuring a physical value
- Patent number 5,757,489
- Issue date May 26, 1998
- Nikon Corporation
- Jun Kawakami
- G01 - MEASURING TESTING
Information Patent Grant
Optical interference measuring apparatus and method for measuring d...
- Patent number 5,748,315
- Issue date May 5, 1998
- Nikon Corporation
- Hitohsi Kawai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
RETICLE, RETICLE UNIT, RIFLE SCOPE, AND OPTICAL APPARATUS
- Publication number 20200292838
- Publication date Sep 17, 2020
- Nikon Corporation
- Koichi WATANABE
- F41 - WEAPONS
Information Patent Application
Method and apparatus for point diffraction interferometry
- Publication number 20040252311
- Publication date Dec 16, 2004
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring interference and apparatus for measuring inter...
- Publication number 20030174342
- Publication date Sep 18, 2003
- Jun Kawakami
- G01 - MEASURING TESTING