Jun Koshoubu

Person

Hachioji-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ultraviolet curing resin property measuring apparatus
- Patent number 8,763,447
- Issue date Jul 1, 2014
- Jasco Corporation
- Toshiyuki Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Circular dichroism spectrometer having alignment mechanism
- Patent number 8,749,780
- Issue date Jun 10, 2014
- Jasco Corporation
- Tetsuji Sunami
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic total reflection measuring apparatus
- Patent number 8,531,674
- Issue date Sep 10, 2013
- Jasco Corporation
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic-measurement apparatus
- Patent number 7,954,069
- Issue date May 31, 2011
- Jasco Corporation
- Masaaki Yumoto
- G02 - OPTICS
Information Patent Grant
Microscope
- Patent number 7,903,253
- Issue date Mar 8, 2011
- Jasco Corporation
- Jun Koshoubu
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic-measurement apparatus
- Patent number 7,869,039
- Issue date Jan 11, 2011
- Jasco Corporation
- Kenichi Akao
- G01 - MEASURING TESTING
Information Patent Grant
Noise-component removing method
- Patent number 7,693,689
- Issue date Apr 6, 2010
- Jasco Corporation
- Jun Koshoubu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Attenuated-total-reflection measurement apparatus
- Patent number 7,492,460
- Issue date Feb 17, 2009
- Jasco Corporation
- Jun Koshoubu
- G01 - MEASURING TESTING
Information Patent Grant
Mapping-measurement apparatus
- Patent number 7,224,460
- Issue date May 29, 2007
- Jasco Corporation
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Grant
Infrared circular dichroism measuring apparatus and infrared circul...
- Patent number 7,002,692
- Issue date Feb 21, 2006
- Jasco Corporation
- Kenichi Akao
- G01 - MEASURING TESTING
Information Patent Grant
Method of acquiring data from multi-element detector in infrared im...
- Patent number 6,891,162
- Issue date May 10, 2005
- Jasco Corporation
- Toshiyuki Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method of acquiring data from multi-element detector in infrared im...
- Patent number 6,867,417
- Issue date Mar 15, 2005
- Jasco Corporation
- Toshiyuki Nagoshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL
- Publication number 20220260816
- Publication date Aug 18, 2022
- JASCO CORPORATION
- Tomohiro KATSUMATA
- G01 - MEASURING TESTING
Information Patent Application
Circular Dichroism Spectrometer Having Alignment Mechanism
- Publication number 20130258334
- Publication date Oct 3, 2013
- JASCO CORPORATION
- Tetsuji Sunami
- G01 - MEASURING TESTING
Information Patent Application
Ultraviolet Curing Resin Property Measuring Apparatus
- Publication number 20110252871
- Publication date Oct 20, 2011
- JASCO INTERNATIONAL CO., LTD.
- Toshiyuki Nagoshi
- G01 - MEASURING TESTING
Information Patent Application
Microscopic Total Reflection Measuring Apparatus
- Publication number 20100309455
- Publication date Dec 9, 2010
- JASCO CORPORATION
- Noriaki Soga
- G02 - OPTICS
Information Patent Application
Microscope
- Publication number 20100110441
- Publication date May 6, 2010
- JASCO CORPORATION
- Jun Koshoubu
- G02 - OPTICS
Information Patent Application
Microscopic-Measurement Apparatus
- Publication number 20090103173
- Publication date Apr 23, 2009
- JASCO CORPORATION
- Kenichi Akao
- G02 - OPTICS
Information Patent Application
Microscopic-Measurement Apparatus
- Publication number 20080282197
- Publication date Nov 13, 2008
- JASCO CORPORATION
- Masaaki Yumoto
- G02 - OPTICS
Information Patent Application
Noise-Component Removing Method
- Publication number 20080154549
- Publication date Jun 26, 2008
- JASCO CORPORATION
- Jun Koshoubu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Attenuated-total-reflection measurement apparatus
- Publication number 20060164633
- Publication date Jul 27, 2006
- JASCO CORPORATION
- Jun Koshoubu
- G01 - MEASURING TESTING
Information Patent Application
Microscope
- Publication number 20060119856
- Publication date Jun 8, 2006
- JASCO CORPORATION
- Jun Koshoubu
- G02 - OPTICS
Information Patent Application
Mapping-measurement apparatus
- Publication number 20050088656
- Publication date Apr 28, 2005
- JASCO CORPORATION
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Application
Infrared circular dichroism measuring apparatus and infrared circul...
- Publication number 20030234937
- Publication date Dec 25, 2003
- JASCO CORPORATION
- Kenichi Akao
- G01 - MEASURING TESTING
Information Patent Application
Method of acquiring data from multi-element detector in infrared im...
- Publication number 20030149532
- Publication date Aug 7, 2003
- JASCO CORPORATION
- Toshiyuki Nagoshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method of acquiring data from multi-element detector in infrared im...
- Publication number 20030146386
- Publication date Aug 7, 2003
- JASCO CORPORATION
- Toshiyuki Nagoshi
- G01 - MEASURING TESTING

Jun Koshoubu

Person

Patents Grantslast 30 patents

Ultraviolet curing resin property measuring apparatus

Circular dichroism spectrometer having alignment mechanism

Microscopic total reflection measuring apparatus

Microscopic-measurement apparatus

Microscope

Microscopic-measurement apparatus

Noise-component removing method

Attenuated-total-reflection measurement apparatus

Mapping-measurement apparatus

Infrared circular dichroism measuring apparatus and infrared circul...

Method of acquiring data from multi-element detector in infrared im...

Method of acquiring data from multi-element detector in infrared im...

Patents Applicationslast 30 patents

MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL

Circular Dichroism Spectrometer Having Alignment Mechanism

Ultraviolet Curing Resin Property Measuring Apparatus

Microscopic Total Reflection Measuring Apparatus

Microscope

Microscopic-Measurement Apparatus

Microscopic-Measurement Apparatus

Noise-Component Removing Method

Attenuated-total-reflection measurement apparatus

Microscope

Mapping-measurement apparatus

Infrared circular dichroism measuring apparatus and infrared circul...

Method of acquiring data from multi-element detector in infrared im...

Method of acquiring data from multi-element detector in infrared im...