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Jun Matsushima

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  • Sagamihara, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device
    • Patent number 8,037,384
    • Issue date Oct 11, 2011
    • Hitachi, Ltd.
    • Takumi Hasegawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20090172488
    • Publication date Jul 2, 2009
    • Hitachi, Ltd.
    • Takumi Hasegawa
    • G01 - MEASURING TESTING