Jun Matsushima

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method of controlling self-diagnosis
- Patent number 11,255,907
- Issue date Feb 22, 2022
- Renesas Electronics Corporation
- Yoshinori Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and diagnostic method therefor
- Patent number 10,580,513
- Issue date Mar 3, 2020
- Renesas Electronics Corporation
- Yoichi Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and diagnosis method thereof
- Patent number 10,504,609
- Issue date Dec 10, 2019
- Renesas Electronics Corporation
- Yoichi Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and scan test method including writing and rea...
- Patent number 10,295,597
- Issue date May 21, 2019
- Renesas Electronics Corporation
- Yoichi Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, electronic control system and method for eval...
- Patent number 10,288,683
- Issue date May 14, 2019
- Renesas Electronics Corporation
- Yoichi Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and diagnostic test method for both single-poi...
- Patent number 10,281,525
- Issue date May 7, 2019
- Renesas Electronics Corporation
- Yoichi Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Test point circuit, scan flip-flop for sequential test, semiconduct...
- Patent number 10,078,114
- Issue date Sep 18, 2018
- Renesas Electronics Corporation
- Hiroyuki Iwata
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for designing semiconductor device, and semico...
- Patent number 8,887,015
- Issue date Nov 11, 2014
- Renesas Electronics Corporation
- Hiroyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test access control for plural processors of an integrated circuit
- Patent number 7,743,278
- Issue date Jun 22, 2010
- Renesas Technology Corp.
- Yuri Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Torque sensor
- Patent number 4,984,474
- Issue date Jan 15, 1991
- Copal Company Limited
- Jun Matsushima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND TESTING METHOD FOR MEMORY CIRCUIT
- Publication number 20230207034
- Publication date Jun 29, 2023
- RENESAS ELECTRONICS CORPORATION
- Shunya NAGATA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF CONTROLLING SELF-DIAGNOSIS
- Publication number 20200072903
- Publication date Mar 5, 2020
- RENESAS ELECTRONICS CORPORATION
- Yoshinori NISHIDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND DIAGNOSTIC METHOD THEREFOR
- Publication number 20180277237
- Publication date Sep 27, 2018
- RENESAS ELECTRONICS CORPORATION
- Yoichi MAEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND DIAGNOSTIC TEST METHOD
- Publication number 20180180672
- Publication date Jun 28, 2018
- Renesas Electric Corporation
- Yoichi MAEDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND DIAGNOSIS METHOD THEREOF
- Publication number 20180090225
- Publication date Mar 29, 2018
- RENESAS ELECTRONICS CORPORATION
- Yoichi MAEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND SCAN TEST METHOD
- Publication number 20180059183
- Publication date Mar 1, 2018
- RENESAS ELECTRONICS CORPORATION
- Yoichi MAEDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, ELECTRONIC CONTROL SYSTEM AND METHOD FOR EVAL...
- Publication number 20170343607
- Publication date Nov 30, 2017
- RENESAS ELECTRONICS CORPORATION
- Yoichi MAEDA
- G01 - MEASURING TESTING
Information Patent Application
TEST POINT CIRCUIT, SCAN FLIP-FLOP FOR SEQUENTIAL TEST, SEMICONDUCT...
- Publication number 20170089979
- Publication date Mar 30, 2017
- RENESAS ELECTRONICS CORPORATION
- Hiroyuki IWATA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DESIGNING SEMICONDUCTOR DEVICE, AND SEMICO...
- Publication number 20130019134
- Publication date Jan 17, 2013
- Renesas Electronics Corporation
- Hiroyuki IWATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20070226558
- Publication date Sep 27, 2007
- RENESAS TECHNOLOGY CORP.
- Yuri Ikeda
- G01 - MEASURING TESTING

Jun Matsushima

Person

Patents Grantslast 30 patents

Semiconductor device and method of controlling self-diagnosis

Semiconductor device and diagnostic method therefor

Semiconductor device and diagnosis method thereof

Semiconductor device and scan test method including writing and rea...

Semiconductor device, electronic control system and method for eval...

Semiconductor device and diagnostic test method for both single-poi...

Test point circuit, scan flip-flop for sequential test, semiconduct...

Apparatus and method for designing semiconductor device, and semico...

Test access control for plural processors of an integrated circuit

Torque sensor

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND TESTING METHOD FOR MEMORY CIRCUIT

SEMICONDUCTOR DEVICE AND METHOD OF CONTROLLING SELF-DIAGNOSIS

SEMICONDUCTOR DEVICE AND DIAGNOSTIC METHOD THEREFOR

SEMICONDUCTOR DEVICE AND DIAGNOSTIC TEST METHOD

SEMICONDUCTOR DEVICE AND DIAGNOSIS METHOD THEREOF

SEMICONDUCTOR DEVICE AND SCAN TEST METHOD

SEMICONDUCTOR DEVICE, ELECTRONIC CONTROL SYSTEM AND METHOD FOR EVAL...

TEST POINT CIRCUIT, SCAN FLIP-FLOP FOR SEQUENTIAL TEST, SEMICONDUCT...

APPARATUS AND METHOD FOR DESIGNING SEMICONDUCTOR DEVICE, AND SEMICO...

Semiconductor integrated circuit device