Jun Ogawa

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Technique for testability of semiconductor integrated circuit
- Patent number 7,168,004
- Issue date Jan 23, 2007
- Matsushita Electric Industrial Co., Ltd.
- Yukio Sugimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Technique for testability of semiconductor integrated circuit
- Publication number 20040153806
- Publication date Aug 5, 2004
- Yukio Sugimura
- G01 - MEASURING TESTING