Jun-seog Seong

Follow

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection system
- Patent number 8,976,348
- Issue date Mar 10, 2015
- Samsung Electronics Co., Ltd.
- Hwan-seok Jang
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting wafer
- Patent number 8,711,348
- Issue date Apr 29, 2014
- Samsung Electronics Co., Ltd.
- Hwan-seok Jang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF INSPECTING WAFER
- Publication number 20140204371
- Publication date Jul 24, 2014
- Samsung Electronics Co., Ltd.
- Hwan-seok Jang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING WAFER
- Publication number 20110299069
- Publication date Dec 8, 2011
- Samsung Electronics Co., Ltd.
- Hwan-seok Jang
- G06 - COMPUTING CALCULATING COUNTING