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Jun Tang
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Tempe, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Accelerometer having an over travel stop with a stop gap less than...
Patent number
12,105,114
Issue date
Oct 1, 2024
NXP USA, INC.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer having an over travel stop with a stop gap less than...
Patent number
11,768,220
Issue date
Sep 26, 2023
NXP USA, INC.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor sampling with combined sense axes
Patent number
11,726,107
Issue date
Aug 15, 2023
NXP USA, INC.
Andrew C McNeil
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertial sensor with integrated damping structures
Patent number
11,105,826
Issue date
Aug 31, 2021
NXP USA, INC.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Grant
Single axis inertial sensor with suppressed parasitic modes
Patent number
10,809,277
Issue date
Oct 20, 2020
NXP USA, INC.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Grant
Three-axis inertial sensor for detecting linear acceleration forces
Patent number
10,429,407
Issue date
Oct 1, 2019
NXP USA, INC.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Grant
Multi-axis inertial sensor with dual mass and integrated damping st...
Patent number
9,720,012
Issue date
Aug 1, 2017
NXP USA, INC.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Grant
MEMS device with over-travel stop structure and method of fabrication
Patent number
9,638,712
Issue date
May 2, 2017
NXP USA, INC.
Jun Tang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
MEMS Array Structures for Gyroscopes with High Resonant Frequencies
Publication number
20250026629
Publication date
Jan 23, 2025
NXP USA, Inc.
Jun Tang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS ACCELEROMETER WITH VERTICAL STOPS
Publication number
20240329076
Publication date
Oct 3, 2024
NXP USA, Inc.
Jun Tang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELEROMETER HAVING AN OVER TRAVEL STOP WITH A STOP GAP LESS THAN...
Publication number
20230266358
Publication date
Aug 24, 2023
NXP USA, Inc.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER HAVING AN OVER TRAVEL STOP WITH A STOP GAP LESS THAN...
Publication number
20230074541
Publication date
Mar 9, 2023
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Application
INERTIAL SENSOR SAMPLING WITH COMBINED SENSE AXES
Publication number
20210123946
Publication date
Apr 29, 2021
NXP USA, Inc.
Andrew C McNeil
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INERTIAL SENSOR WITH INTEGRATED DAMPING STRUCTURES
Publication number
20210088545
Publication date
Mar 25, 2021
NXP USA, Inc.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Application
SINGLE AXIS INERTIAL SENSOR WITH SUPPRESSED PARASITIC MODES
Publication number
20190187169
Publication date
Jun 20, 2019
NXP USA, Inc.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Application
THREE-AXIS INERTIAL SENSOR FOR DETECTING LINEAR ACCELERATION FORCES
Publication number
20180275161
Publication date
Sep 27, 2018
NXP USA, Inc.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Application
MULTI-AXIS INERTIAL SENSOR WITH DUAL MASS AND INTEGRATED DAMPING ST...
Publication number
20170023608
Publication date
Jan 26, 2017
FREESCALE SEMICONDUCTOR, INC.
JUN TANG
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE WITH OVER-TRAVEL STOP STRUCTURE AND METHOD OF FABRICATION
Publication number
20160216290
Publication date
Jul 28, 2016
FREESCALE SEMICONDUCTOR, INC.
JUN TANG
B81 - MICRO-STRUCTURAL TECHNOLOGY