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Jun Wan
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Wilmington, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
RFID temperature logger incorporating a frequency ratio digitizing...
Patent number
7,474,230
Issue date
Jan 6, 2009
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING
Information
Patent Grant
Emitter area trim scheme for a PTAT current source
Patent number
7,443,226
Issue date
Oct 28, 2008
National Semiconductor Corporation
Peter R. Holloway
G05 - CONTROLLING REGULATING
Information
Patent Grant
Low current offset integrator with signal independent low input cap...
Patent number
7,385,426
Issue date
Jun 10, 2008
National Semiconductor Corporation
Jun Wan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Charge balancing method in a current input ADC
Patent number
7,372,392
Issue date
May 13, 2008
National Semiconductor Corporation
Jun Wan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Frequency ratio digitizing temperature sensor with linearity correc...
Patent number
7,331,708
Issue date
Feb 19, 2008
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING
Information
Patent Grant
Self-regulating process-error trimmable PTAT current source
Patent number
7,236,048
Issue date
Jun 26, 2007
National Semiconductor Corporation
Peter R. Holloway
G05 - CONTROLLING REGULATING
Information
Patent Grant
Dual-channel instrumentation amplifier
Patent number
7,119,612
Issue date
Oct 10, 2006
National Semiconductor Corporation
Peter R. Holloway
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Clock generator circuit stabilized over temperature, process and po...
Patent number
7,075,353
Issue date
Jul 11, 2006
National Semiconductor Corporation
Jun Wan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Super-PTAT current source
Patent number
7,075,360
Issue date
Jul 11, 2006
National Semiconductor Corporation
Peter R. Holloway
G05 - CONTROLLING REGULATING
Information
Patent Grant
Correlated double sampling modulation system with reduced latency o...
Patent number
7,075,475
Issue date
Jul 11, 2006
National Semiconductor Corporation
Jun Wan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Self-regulating low current watchdog current source
Patent number
7,015,744
Issue date
Mar 21, 2006
National Semiconductor Corporation
Peter R. Holloway
G05 - CONTROLLING REGULATING
Information
Patent Grant
Power-on reset circuit with low standby current and self-adaptive r...
Patent number
7,015,732
Issue date
Mar 21, 2006
National Semiconductor Corporation
Peter R. Holloway
G01 - MEASURING TESTING
Information
Patent Grant
Digitizing temperature measurement system and method of operation
Patent number
6,962,436
Issue date
Nov 8, 2005
National Semiconductor Corporation
Peter R. Holloway
G01 - MEASURING TESTING
Information
Patent Grant
Synchronized delta-VBE measurement system
Patent number
6,957,910
Issue date
Oct 25, 2005
National Semiconductor Corporation
Jun Wan
G01 - MEASURING TESTING
Information
Patent Grant
Digitizing ohmmeter system
Patent number
6,930,495
Issue date
Aug 16, 2005
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING
Information
Patent Grant
Digitizing ohmmeter system
Patent number
6,903,558
Issue date
Jun 7, 2005
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING
Information
Patent Grant
Digitizing temperature measurement system
Patent number
6,869,216
Issue date
Mar 22, 2005
National Semiconductor Corporation
Peter R. Holloway
G01 - MEASURING TESTING
Information
Patent Grant
Constant temperature coefficient self-regulating CMOS current source
Patent number
6,831,504
Issue date
Dec 14, 2004
National Semiconductor Corporation
Peter R. Holloway
G05 - CONTROLLING REGULATING
Information
Patent Grant
Low noise correlated double sampling modulation system
Patent number
6,750,796
Issue date
Jun 15, 2004
National Semiconductor Corporation
Peter R. Holloway
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method for synchronized delta-VBE measurement for calculating die t...
Patent number
6,736,540
Issue date
May 18, 2004
National Semiconductor Corporation
Gary E. Sheehan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RFID Temperature Logger Incorporating A Frequency Ratio Digitizing...
Publication number
20070205916
Publication date
Sep 6, 2007
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING
Information
Patent Application
Frequency ratio digitizing temperature sensor with linearity correc...
Publication number
20070195856
Publication date
Aug 23, 2007
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING