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Jun YAMAZAKI
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Santa Clara, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Similarity detection of abnormal waveforms using PMU measurement
Patent number
10,598,702
Issue date
Mar 24, 2020
Hitachi, Ltd.
Norifumi Nishikawa
G01 - MEASURING TESTING
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Patent Grant
Estimating the locations of power system events using PMU measurements
Patent number
9,746,511
Issue date
Aug 29, 2017
Hitachi, Ltd.
Alex Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SIMILARITY DETECTION OF ABNORMAL WAVEFORMS USING PMU MEASUREMENT
Publication number
20190056436
Publication date
Feb 21, 2019
Hitachi, Ltd
Norifumi NISHIKAWA
G01 - MEASURING TESTING
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Patent Application
DATA COST EFFECTIVE FAST SIMILARITY SEARCH WITH PRIORITY ACCESS
Publication number
20190033351
Publication date
Jan 31, 2019
Hitachi, Ltd
Mika TAKATA
G05 - CONTROLLING REGULATING
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Patent Application
ESTIMATING THE LOCATIONS OF POWER SYSTEM EVENTS USING PMU MEASUREMENTS
Publication number
20170146585
Publication date
May 25, 2017
HITACHI, LTD.
Alex WANG
G01 - MEASURING TESTING