Jun Ye

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 11,461,532
- Issue date Oct 4, 2022
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of performing model-based scanner tuning
- Patent number 11,372,337
- Issue date Jun 28, 2022
- ASML Netherlands B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanning lidar systems for three-dimensional sensing
- Patent number 11,300,684
- Issue date Apr 12, 2022
- CEPTON TECHNOLOGIES, INC.
- Jun Pei
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Fast freeform source and mask co-optimization method
- Patent number 11,042,687
- Issue date Jun 22, 2021
- ASML Netherlands B.V.
- Luoqi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems for vibration cancellation in a lidar system
- Patent number 10,955,530
- Issue date Mar 23, 2021
- CEPTON TECHNOLOGIES, INC.
- Jun Pei
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for parameter-sensitive and orthogonal gauge de...
- Patent number 10,846,442
- Issue date Nov 24, 2020
- ASML Netherlands B.V.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 10,839,131
- Issue date Nov 17, 2020
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of performing model-based scanner tuning
- Patent number 10,795,266
- Issue date Oct 6, 2020
- ASML Netherlands B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanning illuminated three-dimensional imaging systems
- Patent number 10,754,036
- Issue date Aug 25, 2020
- CEPTON TECHNOLOGIES, INC.
- Jun Pei
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Scanning apparatuses and methods for a lidar system
- Patent number 10,690,754
- Issue date Jun 23, 2020
- CEPTON TECHNOLOGIES, INC.
- Jun Pei
- G01 - MEASURING TESTING
Information Patent Grant
Fast freeform source and mask co-optimization method
- Patent number 10,592,633
- Issue date Mar 17, 2020
- ASML Netherlands B.V.
- Luoqi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Model-based scanner tuning systems and methods
- Patent number 10,569,469
- Issue date Feb 25, 2020
- ASML Netherlands B.V.
- Yu Cao
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Scanning lidar systems for three-dimensional sensing
- Patent number 10,451,740
- Issue date Oct 22, 2019
- CEPTON TECHNOLOGIES, INC.
- Jun Pei
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Computation pipeline of single-pass multiple variant calls
- Patent number 10,424,395
- Issue date Sep 24, 2019
- Jun Ye
Information Patent Grant
Computation pipeline of location-dependent variant calls
- Patent number 10,424,396
- Issue date Sep 24, 2019
- Jun Ye
Information Patent Grant
Methods and systems for pattern design with tailored response to wa...
- Patent number 10,423,075
- Issue date Sep 24, 2019
- ASML Netherlands B.V.
- Hanying Feng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for lithography process-window-maximizing optical...
- Patent number 10,310,371
- Issue date Jun 4, 2019
- ASML Netherlands B.V.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 10,198,549
- Issue date Feb 5, 2019
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and system for model-based generic matching and tuning
- Patent number 10,169,522
- Issue date Jan 1, 2019
- ASML Netherlands B.V.
- Yu Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Model-based process simulation systems and methods
- Patent number 10,137,643
- Issue date Nov 27, 2018
- ASML Netherlands B.V.
- Yu Cao
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Methods and systems for parameter-sensitive and orthogonal gauge de...
- Patent number 10,025,885
- Issue date Jul 17, 2018
- ASML Netherlands B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computational process control
- Patent number 10,007,192
- Issue date Jun 26, 2018
- ASML Netherlands B.V.
- Jun Ye
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Fast freeform source and mask co-optimization method
- Patent number 9,953,127
- Issue date Apr 24, 2018
- ASML Netherlands B.V.
- Luoqi Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of performing model-based scanner tuning
- Patent number 9,921,485
- Issue date Mar 20, 2018
- ASML Netherlands B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods for performing model-based lithography guided layout design
- Patent number 9,779,186
- Issue date Oct 3, 2017
- ASML Netherlands B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lens heating compensation systems and methods
- Patent number 9,746,784
- Issue date Aug 29, 2017
- ASML Netherlands B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern selection for lithographic model calibration
- Patent number 9,672,301
- Issue date Jun 6, 2017
- ASML Netherlands B.V.
- Yu Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanner model representation with transmission cross coefficients
- Patent number 9,645,509
- Issue date May 9, 2017
- ASML Netherlands B.V.
- Yu Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optimization of source, mask and projection optics
- Patent number 9,619,603
- Issue date Apr 11, 2017
- ASML Netherlands B.V.
- Hanying Feng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Information matrix creation and calibration test pattern selection...
- Patent number 9,588,439
- Issue date Mar 7, 2017
- ASML Netherlands B.V.
- Antoine Jean Bruguier
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS, PRODUCTS, AND METHODS FOR GENERATING PATTERNING DEVICES AN...
- Publication number 20230185183
- Publication date Jun 15, 2023
- ASML NETHERLANDS B.V.
- Jiuning HU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL LOCAL OSCILLATOR FOR ALL-OPTICAL TIME SCALES, AND ASSOCIATE...
- Publication number 20220155730
- Publication date May 19, 2022
- The Regents of the University of Colorado, a Body Corporate
- Jun Ye
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20210064811
- Publication date Mar 4, 2021
- ASML NETHERLANDS B.V.
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERFORMING MODEL-BASED SCANNER TUNING
- Publication number 20210018844
- Publication date Jan 21, 2021
- ASML NETHERLANDS B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FAST FREEFORM SOURCE AND MASK CO-OPTIMIZATION METHOD
- Publication number 20200218850
- Publication date Jul 9, 2020
- Luoqi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODEL-BASED SCANNER TUNING SYSTEMS AND METHODS
- Publication number 20200189192
- Publication date Jun 18, 2020
- ASML NETHERLANDS B.V.
- Yu CAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING LIDAR SYSTEMS FOR THREE-DIMENSIONAL SENSING
- Publication number 20200096642
- Publication date Mar 26, 2020
- Cepton Technologies, Inc.
- Jun Pei
- B60 - VEHICLES IN GENERAL
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20190163866
- Publication date May 30, 2019
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR PARAMETER-SENSITIVE AND ORTHOGONAL GAUGE DE...
- Publication number 20180322224
- Publication date Nov 8, 2018
- ASML NETHERLANDS B.V.
- Jun YE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAST FREEFORM SOURCE AND MASK CO-OPTIMIZATION METHOD
- Publication number 20180239861
- Publication date Aug 23, 2018
- ASML NETHERLANDS B.V.
- Luoqi CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERFORMING MODEL-BASED SCANNER TUNING
- Publication number 20180231896
- Publication date Aug 16, 2018
- ASML NETHERLANDS B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEMS FOR VIBRATION CANCELLATION IN A LIDAR SYSTEM
- Publication number 20180180721
- Publication date Jun 28, 2018
- Cepton Tecnhologies, Inc.
- Jun PEI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING APPARATUSES AND METHODS FOR A LIDAR SYSTEM
- Publication number 20180180720
- Publication date Jun 28, 2018
- Cepton Tecnhologies, Inc.
- Jun PEI
- G01 - MEASURING TESTING
Information Patent Application
Scanning Illuminated Three-Dimensional Imaging Systems
- Publication number 20170310948
- Publication date Oct 26, 2017
- Cepton Technologies, Inc.
- Jun Pei
- B60 - VEHICLES IN GENERAL
Information Patent Application
Scanning Lidar Systems for Three-Dimensional Sensing
- Publication number 20170307758
- Publication date Oct 26, 2017
- Cepton Technologies, Inc.
- Jun Pei
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20160357900
- Publication date Dec 8, 2016
- ASML NETHERLANDS B.V.
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTATION PIPELINE OF LOCATION-DEPENDENT VARIANT CALLS
- Publication number 20160283655
- Publication date Sep 29, 2016
- Sentieon Inc.
- Jun Ye
- C40 - COMBINATORIAL CHEMISTRY
Information Patent Application
COMPUTATION PIPELINE OF SINGLE-PASS MULTIPLE VARIANT CALLS
- Publication number 20160283654
- Publication date Sep 29, 2016
- Sentieon Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR LITHOGRAPHY PROCESS-WINDOW-MAXIMIZING OPTICAL...
- Publication number 20160246168
- Publication date Aug 25, 2016
- ASML NETHERLANDS B.V.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERFORMING MODEL-BASED SCANNER TUNING
- Publication number 20160033872
- Publication date Feb 4, 2016
- ASML NETHERLANDS B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FAST FREEFORM SOURCE AND MASK CO-OPTIMIZATION METHOD
- Publication number 20150356234
- Publication date Dec 10, 2015
- ASML NETHERLANDS B.V.
- Luoqi CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED DEVICE IDENTIFICATION
- Publication number 20150200788
- Publication date Jul 16, 2015
- Christopher Todd Thomas
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHODS AND SYSTEMS FOR PARAMETER-SENSITIVE AND ORTHOGONAL GAUGE DE...
- Publication number 20150186557
- Publication date Jul 2, 2015
- ASML NETHERLANDS B.V.
- Jun YE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR PATTERN DESIGN WITH TAILORED RESPONSE TO WA...
- Publication number 20150153651
- Publication date Jun 4, 2015
- ASML NETHERLANDS B.V.
- Hanying Feng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20150135146
- Publication date May 14, 2015
- ASML NETHERLANDS B.V.
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEM FOR MODEL-BASED GENERIC MATCHING AND TUNING
- Publication number 20150074619
- Publication date Mar 12, 2015
- ASML NETHERLANDS B.V.
- Yu Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZATION OF SOURCE, MASK AND PROJECTION OPTICS
- Publication number 20150074622
- Publication date Mar 12, 2015
- ASML NETHERLANDS B.V.
- Hanying Feng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODEL-BASED SCANNER TUNING SYSTEMS AND METHODS
- Publication number 20150045935
- Publication date Feb 12, 2015
- ASML NETHERLANDS B.V.
- Yu CAO
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
COMPUTATIONAL PROCESS CONTROL
- Publication number 20150025668
- Publication date Jan 22, 2015
- ASML NETHERLANDS B.V.
- Jun YE
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
INTEGRATION OF LITHOGRAPHY APPARATUS AND MASK OPTIMIZATION PROCESS...
- Publication number 20140365983
- Publication date Dec 11, 2014
- ASML NETHERLANDS B.V.
- Luoqi Chen
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Three-dimensional mask model for photolithography simulation

Method of performing model-based scanner tuning

Scanning lidar systems for three-dimensional sensing

Fast freeform source and mask co-optimization method

Systems for vibration cancellation in a lidar system

Methods and systems for parameter-sensitive and orthogonal gauge de...

Three-dimensional mask model for photolithography simulation

Method of performing model-based scanner tuning

Scanning illuminated three-dimensional imaging systems

Scanning apparatuses and methods for a lidar system

Fast freeform source and mask co-optimization method

Model-based scanner tuning systems and methods

Scanning lidar systems for three-dimensional sensing

Computation pipeline of single-pass multiple variant calls

Computation pipeline of location-dependent variant calls

Methods and systems for pattern design with tailored response to wa...

Method and system for lithography process-window-maximizing optical...

Three-dimensional mask model for photolithography simulation

Methods and system for model-based generic matching and tuning

Model-based process simulation systems and methods

Methods and systems for parameter-sensitive and orthogonal gauge de...

Computational process control

Fast freeform source and mask co-optimization method

Method of performing model-based scanner tuning

Methods for performing model-based lithography guided layout design

Lens heating compensation systems and methods

Pattern selection for lithographic model calibration

Scanner model representation with transmission cross coefficients

Optimization of source, mask and projection optics

Information matrix creation and calibration test pattern selection...

Patents Applicationslast 30 patents

SYSTEMS, PRODUCTS, AND METHODS FOR GENERATING PATTERNING DEVICES AN...

OPTICAL LOCAL OSCILLATOR FOR ALL-OPTICAL TIME SCALES, AND ASSOCIATE...

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

METHOD OF PERFORMING MODEL-BASED SCANNER TUNING

FAST FREEFORM SOURCE AND MASK CO-OPTIMIZATION METHOD

MODEL-BASED SCANNER TUNING SYSTEMS AND METHODS

SCANNING LIDAR SYSTEMS FOR THREE-DIMENSIONAL SENSING

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

METHODS AND SYSTEMS FOR PARAMETER-SENSITIVE AND ORTHOGONAL GAUGE DE...

FAST FREEFORM SOURCE AND MASK CO-OPTIMIZATION METHOD

METHOD OF PERFORMING MODEL-BASED SCANNER TUNING

SYSTEMS FOR VIBRATION CANCELLATION IN A LIDAR SYSTEM

SCANNING APPARATUSES AND METHODS FOR A LIDAR SYSTEM

Scanning Illuminated Three-Dimensional Imaging Systems

Scanning Lidar Systems for Three-Dimensional Sensing

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

COMPUTATION PIPELINE OF LOCATION-DEPENDENT VARIANT CALLS

COMPUTATION PIPELINE OF SINGLE-PASS MULTIPLE VARIANT CALLS

METHOD AND SYSTEM FOR LITHOGRAPHY PROCESS-WINDOW-MAXIMIZING OPTICAL...

METHOD OF PERFORMING MODEL-BASED SCANNER TUNING

FAST FREEFORM SOURCE AND MASK CO-OPTIMIZATION METHOD

AUTOMATED DEVICE IDENTIFICATION

METHODS AND SYSTEMS FOR PARAMETER-SENSITIVE AND ORTHOGONAL GAUGE DE...

METHODS AND SYSTEMS FOR PATTERN DESIGN WITH TAILORED RESPONSE TO WA...

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

METHODS AND SYSTEM FOR MODEL-BASED GENERIC MATCHING AND TUNING

OPTIMIZATION OF SOURCE, MASK AND PROJECTION OPTICS

MODEL-BASED SCANNER TUNING SYSTEMS AND METHODS

COMPUTATIONAL PROCESS CONTROL

INTEGRATION OF LITHOGRAPHY APPARATUS AND MASK OPTIMIZATION PROCESS...