Jun-Yean Chiou

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Taichung, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for high voltage device crystal defect detection
- Patent number 9,658,278
- Issue date May 23, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun Hao Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining two dimensional doping profile...
- Patent number 6,890,772
- Issue date May 10, 2005
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chin-Kai Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Utilizing vacuum ultraviolet (VUV) exposure to remove halos of carb...
- Patent number 6,627,363
- Issue date Sep 30, 2003
- Taiwan Semiconductor Manufacturing Company
- Vincent Wen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR HIGH VOLTAGE DEVICE CRYSTAL DEFECT DETECTION
- Publication number 20150212146
- Publication date Jul 30, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun Hao LIAO
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining two dimensional doping profile...
- Publication number 20030127601
- Publication date Jul 10, 2003
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chin-Kai Liu
- H01 - BASIC ELECTRIC ELEMENTS