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Junbae KIM
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Seongnam-si, KR
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Patents Grants
last 30 patents
Information
Patent Grant
System and method of testing a semiconductor device and method of f...
Patent number
11,137,435
Issue date
Oct 5, 2021
Samsung Electronics Co., Ltd.
Junbae Kim
G01 - MEASURING TESTING
Information
Patent Grant
Integrated protecting circuit of semiconductor device
Patent number
10,475,504
Issue date
Nov 12, 2019
Samsung Electronics Co., Ltd.
Se-Young Kim
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR PACKAGE
Publication number
20250038134
Publication date
Jan 30, 2025
Samsung Electronics Co., Ltd.
Junbae KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME
Publication number
20240387462
Publication date
Nov 21, 2024
Samsung Electronics Co., Ltd.
Junbae KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF
Publication number
20240304564
Publication date
Sep 12, 2024
Samsung Electronics Co., Ltd.
Junbae KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICES INCLUDING INDUCTOR STRUCTURES
Publication number
20240030128
Publication date
Jan 25, 2024
Samsung Electronics Co., Ltd.
Jaepil Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE INCLUDING PAD PATTERN
Publication number
20240008265
Publication date
Jan 4, 2024
Samsung Electronics Co., Ltd.
Jaepil Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE AND METHOD OF F...
Publication number
20200033389
Publication date
Jan 30, 2020
Samsung Electronics Co., Ltd.
Junbae KIM
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED PROTECTING CIRCUIT OF SEMICONDUCTOR DEVICE
Publication number
20170125085
Publication date
May 4, 2017
Samsung Electronics Co., Ltd.
Se-Young KIM
G11 - INFORMATION STORAGE