Junbae KIM

Person

Seongnam-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
System and method of testing a semiconductor device and method of f...
- Patent number 11,137,435
- Issue date Oct 5, 2021
- Samsung Electronics Co., Ltd.
- Junbae Kim
- G01 - MEASURING TESTING
Information Patent Grant
Integrated protecting circuit of semiconductor device
- Patent number 10,475,504
- Issue date Nov 12, 2019
- Samsung Electronics Co., Ltd.
- Se-Young Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY DEVICES AND MEMORY SYSTEMS INCLUDING THE SAME
- Publication number 20250218478
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Junbae KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR PACKAGE
- Publication number 20250038134
- Publication date Jan 30, 2025
- Samsung Electronics Co., Ltd.
- Junbae KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME
- Publication number 20240387462
- Publication date Nov 21, 2024
- Samsung Electronics Co., Ltd.
- Junbae KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20240304564
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- Junbae KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES INCLUDING INDUCTOR STRUCTURES
- Publication number 20240030128
- Publication date Jan 25, 2024
- Samsung Electronics Co., Ltd.
- Jaepil Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING PAD PATTERN
- Publication number 20240008265
- Publication date Jan 4, 2024
- Samsung Electronics Co., Ltd.
- Jaepil Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE AND METHOD OF F...
- Publication number 20200033389
- Publication date Jan 30, 2020
- Samsung Electronics Co., Ltd.
- Junbae KIM
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED PROTECTING CIRCUIT OF SEMICONDUCTOR DEVICE
- Publication number 20170125085
- Publication date May 4, 2017
- Samsung Electronics Co., Ltd.
- Se-Young KIM
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

System and method of testing a semiconductor device and method of f...

Integrated protecting circuit of semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR MEMORY DEVICES AND MEMORY SYSTEMS INCLUDING THE SAME

SEMICONDUCTOR PACKAGE

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME

ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICES INCLUDING INDUCTOR STRUCTURES

SEMICONDUCTOR DEVICE INCLUDING PAD PATTERN

SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE AND METHOD OF F...

INTEGRATED PROTECTING CIRCUIT OF SEMICONDUCTOR DEVICE