Junfei XIA

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Andover, MA, US

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Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICES TO MEASURE ELECTRICAL SIGNALS OF MATERIAL DIS...
- Publication number 20250020629
- Publication date Jan 16, 2025
- Analog Devices, Inc.
- Phillip Michel Nadeau
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, SENSOR ASSEMBLIES AND METHODS
- Publication number 20250012759
- Publication date Jan 9, 2025
- Analog Devices International Unlimited Company
- Alfonso Berduque
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR REDUCING INTERFERENCE BY ONE OR MORE BUBBLES IN A SENSI...
- Publication number 20250012758
- Publication date Jan 9, 2025
- Analog Devices International Unlimited Company
- Alfonso BERDUQUE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING A PROPERTY OF AN ANALYTE
- Publication number 20240369510
- Publication date Nov 7, 2024
- Analog Devices International Unlimited Company
- Youri Victorovitch PONOMAREV
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ASSEMBLY, SYSTEM AND METHOD
- Publication number 20240369508
- Publication date Nov 7, 2024
- Analog Devices International Unlimited Company
- Helen BERNEY
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ASSEMBLY AND METHOD
- Publication number 20240328988
- Publication date Oct 3, 2024
- Analog Devices International Unlimited Company
- Joyce WU
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL