Jung-Che Chang

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
System and method for conducting accelerated soft error rate testing
- Patent number 8,106,664
- Issue date Jan 31, 2012
- Semiconductor Manufacturing International (Shanghai) Corporation
- Jung-Che Chang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Conducting Accelerated Soft Error Rate Testing
- Publication number 20100001738
- Publication date Jan 7, 2010
- Semiconductor Manufacturing International (Shanghai) Corporation
- Jung-Che Chang
- G01 - MEASURING TESTING