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Jung Cheng Ko
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Taichung City, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Clustering for prediction models in process control and for optimal...
Patent number
10,054,938
Issue date
Aug 21, 2018
Taiwan Semiconductor Manufacturing Company, Ltd.
Jung Cheng Ko
G05 - CONTROLLING REGULATING
Information
Patent Grant
Near non-adaptive virtual metrology and chamber control
Patent number
9,588,505
Issue date
Mar 7, 2017
Taiwan Semiconductor Manufacturing Company, Ltd.
Tzu-Yu Wang
G05 - CONTROLLING REGULATING
Information
Patent Grant
Test structure and method of testing electrical characteristics of...
Patent number
9,462,692
Issue date
Oct 4, 2016
Taiwan Semiconductor Manufacturing Company, Ltd.
Shang-Yun Hou
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Forming interconnect structures using pre-ink-printed sheets
Patent number
9,159,673
Issue date
Oct 13, 2015
Taiwan Semiconductor Manufacturing Company, Ltd.
Jung Cheng Ko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test structure and method of testing electrical characteristics of...
Patent number
8,993,432
Issue date
Mar 31, 2015
Taiwan Semiconductor Manufacturing Company, Ltd.
Shang-Yun Hou
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Clustering for Prediction Models in Process Control and for Optimal...
Publication number
20150241876
Publication date
Aug 27, 2015
Taiwan Semiconductor Manufacturing Company, Ltd.
Jung Cheng Ko
G05 - CONTROLLING REGULATING
Information
Patent Application
Test Structure and Method of Testing Electrical Characteristics of...
Publication number
20150208504
Publication date
Jul 23, 2015
Taiwan Semiconductor Manufacturing Company, Ltd.
Shang-Yun Hou
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Forming Interconnect Structures Using Pre-Ink-Printed Sheets
Publication number
20140191395
Publication date
Jul 10, 2014
Taiwan Semiconductor Manufacturing Company, Ltd.
Jung Cheng Ko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Near Non-Adaptive Virtual Metrology and Chamber Control
Publication number
20140088747
Publication date
Mar 27, 2014
Taiwan Semiconductor Manufacturing Company, Ltd.
Tzu-Yu Wang
G05 - CONTROLLING REGULATING
Information
Patent Application
Test Structure and Method of Testing Electrical Characteristics of...
Publication number
20130120018
Publication date
May 16, 2013
Taiwan Semiconductor Manufacturing Company, Ltd.
Shang-Yun Hou
H01 - BASIC ELECTRIC ELEMENTS