Jung-Chih TSAO

Person

Tainan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method of forming semiconductor device
- Patent number 12,142,628
- Issue date Nov 12, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chi-Ming Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a semiconductor device and semiconductor device
- Patent number 12,051,617
- Issue date Jul 30, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Min Han Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming titanium nitride barrier with small surface grai...
- Patent number 11,854,980
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chi-Ming Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Replacement metal gate device structure and method of manufacturing...
- Patent number 11,769,669
- Issue date Sep 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Min Han Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Poisoned metal layer with sloped sidewall for making dual damascene...
- Patent number 11,450,557
- Issue date Sep 20, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Min Han Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensing device and manufacturing method thereof
- Patent number 11,417,700
- Issue date Aug 16, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chih-Chang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming deep trench isolation in radiation sensing substr...
- Patent number 11,404,470
- Issue date Aug 2, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chi-Ming Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming semiconductor device
- Patent number 11,387,274
- Issue date Jul 12, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chi-Ming Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor structure
- Patent number 10,867,889
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Li-Yen Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Block layer in the metal gate of MOS devices
- Patent number 10,840,330
- Issue date Nov 17, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jung-Chih Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of forming the same
- Patent number 10,796,996
- Issue date Oct 6, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chi-Ming Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensing device and manufacturing method thereof
- Patent number 10,741,601
- Issue date Aug 11, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chih-Chang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming deep trench isolation in radiation sensing substr...
- Patent number 10,510,798
- Issue date Dec 17, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chi-Ming Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having stress-neutralized film stack and metho...
- Patent number 10,475,847
- Issue date Nov 12, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chi-Ming Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensing device and manufacturing method thereof
- Patent number 10,157,953
- Issue date Dec 18, 2018
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chih-Chang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming deep trench isolation in radiation sensing substr...
- Patent number 10,134,801
- Issue date Nov 20, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- Chi-Ming Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and manufacturing method thereof
- Patent number 10,074,594
- Issue date Sep 11, 2018
- Taiwan Semiconductor Manufacturing Company Ltd.
- Li-Yen Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through via structure for step coverage improvement
- Patent number 9,991,204
- Issue date Jun 5, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Li-Yen Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device with recess
- Patent number 9,859,124
- Issue date Jan 2, 2018
- Taiwan Semiconductor Manufacturing Company Ltd.
- Li-Yen Fang
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Barrier layer and structure method
- Patent number 9,847,296
- Issue date Dec 19, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Chung Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Block layer in the metal gate of MOS devices
- Patent number 9,735,231
- Issue date Aug 15, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jung-Chih Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through via structure for step coverage improvement
- Patent number 9,711,454
- Issue date Jul 18, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd
- Li-Yen Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensing device and manufacturing method thereof
- Patent number 9,691,804
- Issue date Jun 27, 2017
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chih-Chang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,552,529
- Issue date Oct 8, 2013
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jung-Chih Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Via/contact and damascene structures
- Patent number 8,531,036
- Issue date Sep 10, 2013
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Chieh Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Via/contact and damascene structures and manufacturing methods thereof
- Patent number 8,247,322
- Issue date Aug 21, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Chieh Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alpha tantalum capacitor plate
- Patent number 7,969,708
- Issue date Jun 28, 2011
- Taiwan Semiconductor Company, Ltd.
- Jung-Chih Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for preventing copper peeling in ECP
- Patent number 7,667,835
- Issue date Feb 23, 2010
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsi-Kuei Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for stabilizing plating film impurities
- Patent number 7,481,910
- Issue date Jan 27, 2009
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsien-Ping Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post ECP multi-step anneal/H2 treatment to reduce film impurity
- Patent number 7,432,192
- Issue date Oct 7, 2008
- Taiwan Semiconductor Manufacturing Company
- Hsien-Ping Feng
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR ELECTROCHEMICAL PLATING APPARATUS AND METHOD
- Publication number 20240392463
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jun-Nan Nian
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method of Forming Semiconductor Device
- Publication number 20240379727
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Co., LTD
- Chi-Ming LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240355670
- Publication date Oct 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Min Han HSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MONITORING CHEMICAL MECHANICAL POLISHING
- Publication number 20240051085
- Publication date Feb 15, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jun-Nan NIAN
- B24 - GRINDING POLISHING
Information Patent Application
Method of Forming Semiconductor Device
- Publication number 20220415959
- Publication date Dec 29, 2022
- Taiwan Semiconductor Manufacturing Co., LTD
- Chi-Ming LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A REPLACEMENT METAL GATE DEVICE STRUCTURE
- Publication number 20220384195
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Min Han HSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MAKING A SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
- Publication number 20220384253
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Min Han HSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING DEEP TRENCH ISOLATION IN RADIATION SENSING SUBSTR...
- Publication number 20220359607
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., LTD
- Chi-Ming LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPLACEMENT METAL GATE DEVICE STRUCTURE AND METHOD OF MANUFACTURING...
- Publication number 20220005697
- Publication date Jan 6, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Min Han HSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POISONED METAL LAYER WITH SLOPED SIDEWALL FOR MAKING DUAL DAMASCENE...
- Publication number 20210210378
- Publication date Jul 8, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Min Han HSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20200402916
- Publication date Dec 24, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chi-Ming LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSING DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20200373345
- Publication date Nov 26, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- CHIH-CHANG HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Forming Deep Trench Isolation in Radiation Sensing Substr...
- Publication number 20200119081
- Publication date Apr 16, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Chi-Ming LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Forming Semiconductor Device
- Publication number 20200083278
- Publication date Mar 12, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Chi-Ming LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSING DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20190148442
- Publication date May 16, 2019
- Taiwan Semiconductor Manufacturing company Ltd.
- CHIH-CHANG HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING DEEP TRENCH ISOLATION IN RADIATION SENSING SUBSTR...
- Publication number 20190043915
- Publication date Feb 7, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Chi-Ming LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE
- Publication number 20190019743
- Publication date Jan 17, 2019
- Taiwan Semiconductor Manufacturing company Ltd.
- LI-YEN FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20180261547
- Publication date Sep 13, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chi-Ming LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Block Layer in the Metal Gate of MOS Devices
- Publication number 20170323940
- Publication date Nov 9, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jung-Chih Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING SEMICONDUCTOR DEVICE
- Publication number 20170317134
- Publication date Nov 2, 2017
- Taiwan Semiconductor Manufacturing Co., LTD
- Chi-Ming LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSING DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20170294473
- Publication date Oct 12, 2017
- Taiwan Semiconductor Manufacturing company Ltd.
- CHIH-CHANG HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THROUGH VIA STRUCTURE FOR STEP COVERAGE IMPROVEMENT
- Publication number 20170287841
- Publication date Oct 5, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Li-Yen FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING DEEP TRENCH ISOLATION IN RADIATION SENSING SUBSTR...
- Publication number 20170154917
- Publication date Jun 1, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chi-Ming LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THROUGH VIA STRUCTURE FOR STEP COVERAGE IMPROVEMENT
- Publication number 20170062343
- Publication date Mar 2, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Li-Yen FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20160307823
- Publication date Oct 20, 2016
- Taiwan Semiconductor Manufacturing company Ltd.
- LI-YEN FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH RECESS
- Publication number 20160307761
- Publication date Oct 20, 2016
- Taiwan Semiconductor Manufacturing company Ltd.
- LI-YEN FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSING DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20160307952
- Publication date Oct 20, 2016
- Taiwan Semiconductor Manufacturing company Ltd.
- CHIH-CHANG HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BLOCK LAYER IN THE METAL GATE OF MOS DEVICES
- Publication number 20150279838
- Publication date Oct 1, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jung-Chih Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Barrier Layer and Structure Method
- Publication number 20150235954
- Publication date Aug 20, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Chung Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND FORMATION THEREOF
- Publication number 20150235953
- Publication date Aug 20, 2015
- Taiwan Semiconductor Manufacturing Company Limited
- Jung-Chih Tsao
- H01 - BASIC ELECTRIC ELEMENTS

Jung-Chih TSAO

Person

Patents Grantslast 30 patents

Method of forming semiconductor device

Method of making a semiconductor device and semiconductor device

Method for forming titanium nitride barrier with small surface grai...

Replacement metal gate device structure and method of manufacturing...

Poisoned metal layer with sloped sidewall for making dual damascene...

Image sensing device and manufacturing method thereof

Method of forming deep trench isolation in radiation sensing substr...

Method of forming semiconductor device

Method of manufacturing semiconductor structure

Block layer in the metal gate of MOS devices

Semiconductor device and method of forming the same

Image sensing device and manufacturing method thereof

Method of forming deep trench isolation in radiation sensing substr...

Semiconductor device having stress-neutralized film stack and metho...

Image sensing device and manufacturing method thereof

Method of forming deep trench isolation in radiation sensing substr...

Semiconductor structure and manufacturing method thereof

Through via structure for step coverage improvement

Method of manufacturing semiconductor device with recess

Barrier layer and structure method

Block layer in the metal gate of MOS devices

Through via structure for step coverage improvement

Image sensing device and manufacturing method thereof

Semiconductor device

Via/contact and damascene structures

Via/contact and damascene structures and manufacturing methods thereof

Alpha tantalum capacitor plate

Apparatus and method for preventing copper peeling in ECP

Method and apparatus for stabilizing plating film impurities

Post ECP multi-step anneal/H2 treatment to reduce film impurity

Patents Applicationslast 30 patents

SEMICONDUCTOR ELECTROCHEMICAL PLATING APPARATUS AND METHOD

Method of Forming Semiconductor Device

SEMICONDUCTOR DEVICE

APPARATUS AND METHOD FOR MONITORING CHEMICAL MECHANICAL POLISHING

Method of Forming Semiconductor Device

METHOD OF MANUFACTURING A REPLACEMENT METAL GATE DEVICE STRUCTURE

METHOD OF MAKING A SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

METHOD OF FORMING DEEP TRENCH ISOLATION IN RADIATION SENSING SUBSTR...

REPLACEMENT METAL GATE DEVICE STRUCTURE AND METHOD OF MANUFACTURING...

POISONED METAL LAYER WITH SLOPED SIDEWALL FOR MAKING DUAL DAMASCENE...

SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME

IMAGE SENSING DEVICE AND MANUFACTURING METHOD THEREOF

Method of Forming Deep Trench Isolation in Radiation Sensing Substr...

Method of Forming Semiconductor Device

IMAGE SENSING DEVICE AND MANUFACTURING METHOD THEREOF

METHOD OF FORMING DEEP TRENCH ISOLATION IN RADIATION SENSING SUBSTR...

METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE

SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME

Block Layer in the Metal Gate of MOS Devices

METHOD OF FORMING SEMICONDUCTOR DEVICE

IMAGE SENSING DEVICE AND MANUFACTURING METHOD THEREOF

THROUGH VIA STRUCTURE FOR STEP COVERAGE IMPROVEMENT

METHOD OF FORMING DEEP TRENCH ISOLATION IN RADIATION SENSING SUBSTR...

THROUGH VIA STRUCTURE FOR STEP COVERAGE IMPROVEMENT

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH RECESS

IMAGE SENSING DEVICE AND MANUFACTURING METHOD THEREOF

BLOCK LAYER IN THE METAL GATE OF MOS DEVICES

Barrier Layer and Structure Method

SEMICONDUCTOR DEVICE AND FORMATION THEREOF