Jung-Hoon Bak

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Magnetoresistive random access memory device and method of manufact...
- Patent number 11,462,679
- Issue date Oct 4, 2022
- Samsung Electronics Co., Ltd.
- Jung-Hoon Bak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive random access memory device and method of manufact...
- Patent number 10,833,250
- Issue date Nov 10, 2020
- Samsung Electronics Co., Ltd.
- Jung-Hoon Bak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and electronic system including the same
- Patent number 10,355,200
- Issue date Jul 16, 2019
- Samsung Electronics Co., Ltd.
- Jung-hoon Bak
- G11 - INFORMATION STORAGE
Information Patent Grant
MTJ structures including magnetism induction pattern and magnetores...
- Patent number 10,109,676
- Issue date Oct 23, 2018
- Samsung Electronics Co., Ltd.
- Jung-Hoon Bak
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive random access memory device having magnetic tunnel...
- Patent number 10,056,543
- Issue date Aug 21, 2018
- Samsung Electronics Co., Ltd.
- Jung-Hoon Bak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including via plugs
- Patent number 10,043,966
- Issue date Aug 7, 2018
- Samsung Electronics Co., Ltd.
- Jung-hoon Bak
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER DEFECT TEST APPARATUS, WAFER DEFECT TEST SYSTEM, WAFER TEST M...
- Publication number 20230055058
- Publication date Feb 23, 2023
- Samsung Electronics Co., Ltd.
- SUNG HEE LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAGNETORESISTIVE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MANUFACT...
- Publication number 20210083171
- Publication date Mar 18, 2021
- Samsung Electronics Co., Ltd.
- JUNG-HOON BAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETORESISTIVE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MANUFACT...
- Publication number 20180351080
- Publication date Dec 6, 2018
- Samsung Electronics Co., Ltd.
- JUNG-HOON BAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME
- Publication number 20180205002
- Publication date Jul 19, 2018
- Samsung Electronics Co., Ltd.
- Jung-hoon BAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING VIA PLUGS
- Publication number 20170331031
- Publication date Nov 16, 2017
- Samsung Electronics Co., Ltd.
- Jung-hoon BAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MTJ STRUCTURES AND MAGNETORESISTIVE RANDOM ACCESS MEMORY DEVICES IN...
- Publication number 20170110509
- Publication date Apr 20, 2017
- Jung-Hoon BAK
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetoresistive Random Access Memory Device and Method of Manufact...
- Publication number 20170054070
- Publication date Feb 23, 2017
- Jung-Hoon Bak
- H01 - BASIC ELECTRIC ELEMENTS

Jung-Hoon Bak

Person

Patents Grantslast 30 patents

Magnetoresistive random access memory device and method of manufact...

Magnetoresistive random access memory device and method of manufact...

Semiconductor device and electronic system including the same

MTJ structures including magnetism induction pattern and magnetores...

Magnetoresistive random access memory device having magnetic tunnel...

Semiconductor device including via plugs

Patents Applicationslast 30 patents

WAFER DEFECT TEST APPARATUS, WAFER DEFECT TEST SYSTEM, WAFER TEST M...

MAGNETORESISTIVE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MANUFACT...

MAGNETORESISTIVE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MANUFACT...

SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME

SEMICONDUCTOR DEVICE INCLUDING VIA PLUGS

MTJ STRUCTURES AND MAGNETORESISTIVE RANDOM ACCESS MEMORY DEVICES IN...

Magnetoresistive Random Access Memory Device and Method of Manufact...