Jung HUR

Person

Bucheon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring a three-dimensional shape
- Patent number 12,163,776
- Issue date Dec 10, 2024
- Koh Young Technology Inc.
- Seung-Jun Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Focus-less inspection apparatus and method
- Patent number 12,105,029
- Issue date Oct 1, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Focus-less inspection apparatus and method
- Patent number 11,821,846
- Issue date Nov 21, 2023
- Koh Young Technology Inc.
- Chan Kwon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Focus-less inspection apparatus and method
- Patent number 11,360,031
- Issue date Jun 14, 2022
- Koh Young Technology Inc.
- Chan Kwon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring a three dimensional shape
- Patent number 10,996,050
- Issue date May 4, 2021
- Koh Young Technology Inc.
- Seung-Jun Lee
- G02 - OPTICS
Information Patent Grant
Focus-less inspection apparatus and method
- Patent number 10,890,538
- Issue date Jan 12, 2021
- Koh Young Technology Inc.
- Chan Kwon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Pattern light emitting device capable of having plurality of differ...
- Patent number 10,883,824
- Issue date Jan 5, 2021
- Koh Young Technology Inc.
- Jung Hur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for measuring a three dimensional shape
- Patent number 10,563,978
- Issue date Feb 18, 2020
- Koh Young Technology Inc.
- Seung-Jun Lee
- G02 - OPTICS
Information Patent Grant
Apparatus and method for measuring a three dimensional shape
- Patent number 10,359,276
- Issue date Jul 23, 2019
- Koh Young Technology Inc.
- Seung-Jun Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for measuring a three dimensional shape
- Patent number 9,488,472
- Issue date Nov 8, 2016
- Koh Young Technology Inc.
- Seung-Jun Lee
- G02 - OPTICS
Information Patent Grant
Apparatus and method for measuring a three dimensional shape
- Patent number 9,243,900
- Issue date Jan 26, 2016
- Koh Young Technology Inc.
- Seung-Jun Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Board inspection apparatus using multiple cameras
- Patent number 9,046,498
- Issue date Jun 2, 2015
- Koh Young Technology Inc.
- Jong-Kyu Hong
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring a three-dimensional shape
- Patent number 8,854,610
- Issue date Oct 7, 2014
- Koh Young Technology Inc.
- Seung-Jun Lee
- G01 - MEASURING TESTING
Information Patent Grant
Three dimensional shape measurement apparatus
- Patent number 8,754,936
- Issue date Jun 17, 2014
- Koh Young Technology Inc.
- Jung Hur
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,670,117
- Issue date Mar 11, 2014
- Koh Young Technology Inc.
- Jong-Kyu Hong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE
- Publication number 20250067559
- Publication date Feb 27, 2025
- KOH YOUNG TECHNOLOGY INC.
- Seung-Jun LEE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20240426766
- Publication date Dec 26, 2024
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20240060908
- Publication date Feb 22, 2024
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20220260503
- Publication date Aug 18, 2022
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20210254966
- Publication date Aug 19, 2021
- KOH YOUNG TECHNOLOGY INC.
- Jung HUR
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A THREE-DIMENSIONAL SHAPE
- Publication number 20210207954
- Publication date Jul 8, 2021
- KOH YOUNG TECHNOLOGY INC.
- Seung-Jun LEE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20210102903
- Publication date Apr 8, 2021
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE
- Publication number 20200141721
- Publication date May 7, 2020
- KOH YOUNG TECHNOLOGY INC.
- Seung-Jun LEE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20200116653
- Publication date Apr 16, 2020
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE
- Publication number 20190293413
- Publication date Sep 26, 2019
- KOH YOUNG TECHNOLOGY INC.
- Seung-Jun LEE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PATTERN LIGHT EMITTING DEVICE CAPABLE OF HAVING PLURALITY OF DIFFER...
- Publication number 20190265025
- Publication date Aug 29, 2019
- KOH YOUNG TECHNOLOGY INC.
- Jung HUR
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE
- Publication number 20170038197
- Publication date Feb 9, 2017
- KOH YOUNG TECHNOLOGY INC.
- Seung-Jun Lee
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE
- Publication number 20140354804
- Publication date Dec 4, 2014
- Seung-Jun LEE
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE
- Publication number 20140354805
- Publication date Dec 4, 2014
- Seung-Jun LEE
- G02 - OPTICS
Information Patent Application
WAVELENGTH-CHANGEABLE LASER APPARATUS AND TUNING METHOD USING THE SAME
- Publication number 20130314757
- Publication date Nov 28, 2013
- Jang Il SER
- G02 - OPTICS
Information Patent Application
BOARD INSPECTION APPARATUS
- Publication number 20120287264
- Publication date Nov 15, 2012
- KOH YOUNG TECHNOLOGY INC.
- Jong-Kyu HONG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20120127463
- Publication date May 24, 2012
- KOH YOUNG TECHNOLOGY INC.
- Jong-Kyu Hong
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A THREE-DIMENSIONAL SHAPE
- Publication number 20110050893
- Publication date Mar 3, 2011
- KOH YOUNG TECHNOLOGY INC.
- Seung-Jun Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS
- Publication number 20110001818
- Publication date Jan 6, 2011
- KOH YOUNG TECHNOLOGY INC.
- Jung HUR
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Apparatus and method for measuring a three-dimensional shape

Focus-less inspection apparatus and method

Focus-less inspection apparatus and method

Focus-less inspection apparatus and method

Apparatus and method for measuring a three dimensional shape

Focus-less inspection apparatus and method

Pattern light emitting device capable of having plurality of differ...

Apparatus and method for measuring a three dimensional shape

Apparatus and method for measuring a three dimensional shape

Apparatus and method for measuring a three dimensional shape

Apparatus and method for measuring a three dimensional shape

Board inspection apparatus using multiple cameras

Apparatus and method for measuring a three-dimensional shape

Three dimensional shape measurement apparatus

Inspection apparatus

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE

FOCUS-LESS INSPECTION APPARATUS AND METHOD

FOCUS-LESS INSPECTION APPARATUS AND METHOD

FOCUS-LESS INSPECTION APPARATUS AND METHOD

INSPECTION APPARATUS

APPARATUS AND METHOD FOR MEASURING A THREE-DIMENSIONAL SHAPE

FOCUS-LESS INSPECTION APPARATUS AND METHOD

APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE

FOCUS-LESS INSPECTION APPARATUS AND METHOD

APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE

PATTERN LIGHT EMITTING DEVICE CAPABLE OF HAVING PLURALITY OF DIFFER...

APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE

APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE

APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE

WAVELENGTH-CHANGEABLE LASER APPARATUS AND TUNING METHOD USING THE SAME

BOARD INSPECTION APPARATUS

INSPECTION APPARATUS

APPARATUS AND METHOD FOR MEASURING A THREE-DIMENSIONAL SHAPE

THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS