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Yongin-si, KR
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Patents Grants
last 30 patents
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Patent Grant
Method of processing substrate and method of fabricating semiconduc...
Patent number
10,431,506
Issue date
Oct 1, 2019
Samsung Electronics Co., Ltd.
Dusik Bae
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting impurities in ammonium hydroxide
Patent number
10,309,937
Issue date
Jun 4, 2019
Samsung Electronics Co., Ltd.
Kihyun Kim
C01 - INORGANIC CHEMISTRY
Information
Patent Grant
Conductivity detector and ion chromatography system including the same
Patent number
10,234,435
Issue date
Mar 19, 2019
Samsung Electronics Co., Ltd.
Sunghan Jung
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD OF PROCESSING SUBSTRATE AND METHOD OF FABRICATING SEMICONDUC...
Publication number
20180204777
Publication date
Jul 19, 2018
Samsung Electronics Co., Ltd.
Dusik BAE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR DETECTING IMPURITIES IN AMMONIUM HYDROXIDE
Publication number
20170219538
Publication date
Aug 3, 2017
Samsung Electronics Co., Ltd.
Kihyun Kim
G01 - MEASURING TESTING
Information
Patent Application
CONDUCTIVITY DETECTOR AND ION CHROMATOGRAPHY SYSTEM INCLUDING THE SAME
Publication number
20170108476
Publication date
Apr 20, 2017
Sunghan JUNG
G01 - MEASURING TESTING