Junhee Shin

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YONGIN-SI, KR

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Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 11,686,766
- Issue date Jun 27, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Supply voltage detecting circuit, method of operating the same, ele...
- Patent number 11,650,232
- Issue date May 16, 2023
- Samsung Electronics Co., Ltd.
- Cheolhwan Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Supply voltage detecting circuit, method of operating the same, ele...
- Patent number 11,397,199
- Issue date Jul 26, 2022
- Samsung Electronics Co., Ltd.
- Cheolhwan Lim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20230280398
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE SENSOR CAPABLE OF DETERMINING WHETHER TO CONVERT REFERE...
- Publication number 20230273073
- Publication date Aug 31, 2023
- Samsung Electronics Co., Ltd.
- HAEJUNG CHOI
- G01 - MEASURING TESTING
Information Patent Application
SUPPLY VOLTAGE DETECTING CIRCUIT, METHOD OF OPERATING THE SAME, ELE...
- Publication number 20220357372
- Publication date Nov 10, 2022
- Samsung Electronics Co., Ltd.
- Cheolhwan LIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUPPLY VOLTAGE DETECTING CIRCUIT, METHOD OF OPERATING THE SAME, ELE...
- Publication number 20210239744
- Publication date Aug 5, 2021
- Samsung Electronics Co., Ltd.
- Cheolhwan LIM
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20210199719
- Publication date Jul 1, 2021
- Samsung Electronics Co., Ltd.
- Junhee Shin
- G01 - MEASURING TESTING