Junichi Kakuta

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing a template matching template, as well as a...
- Patent number 8,929,665
- Issue date Jan 6, 2015
- Hitachi High-Technologies Corporation
- Yukari Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting and measuring sample and scanning electron mi...
- Patent number 8,481,934
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope alignment method and scanning electron...
- Patent number 8,188,427
- Issue date May 29, 2012
- Hitachi High-Technologies Corporation
- Junichi Kakuta
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting and measuring sample and scanning electron mi...
- Patent number 7,960,696
- Issue date Jun 14, 2011
- Hitachi High-Technologies Corporation
- Makoto Ezumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR INSPECTING AND MEASURING SAMPLE AND SCANNING ELECTRON MI...
- Publication number 20140001359
- Publication date Jan 2, 2014
- Hitachi High-Technologies Corporation
- Makoto EZUMI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING A TEMPLATE MATCHING TEMPLATE, AS WELL AS A...
- Publication number 20120070089
- Publication date Mar 22, 2012
- Yukari Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INSPECTING AND MEASURING SAMPLE AND SCANNING ELECTRON MI...
- Publication number 20110215243
- Publication date Sep 8, 2011
- Hitachi High-Technologies Corporation
- Makoto EZUMI
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSIS DEVICE OF RECIPE USED FOR SCANNING ELECTRON MICROSCOPE
- Publication number 20110147587
- Publication date Jun 23, 2011
- Kyoungmo Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR INSPECTING AND MEASURING SAMPLE AND SCANNING ELECTRON MI...
- Publication number 20090084954
- Publication date Apr 2, 2009
- Hitachi High-Technologies Corporation
- Makoto EZUMI
- G01 - MEASURING TESTING
Information Patent Application
Scanning Electron Microscope Alignment Method and Scanning Electron...
- Publication number 20090032693
- Publication date Feb 5, 2009
- Hitachi High-Technologies Corporation
- Junichi Kakuta
- G01 - MEASURING TESTING