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Junichi KATANE

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  • Naka, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRON MICROSCOPE
    • Publication number 20240128049
    • Publication date Apr 18, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Katsura TAKAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
    • Publication number 20240120168
    • Publication date Apr 11, 2024
    • Hitachi High-Tech Corporation
    • Takashi Ohshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON BEAM APPLICATION DEVICE
    • Publication number 20230335367
    • Publication date Oct 19, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takashi OHSHIMA
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20230274907
    • Publication date Aug 31, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Teruo KOHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SAMPLE IMAGE OBSERVATION DEVICE AND METHOD FOR SAME
    • Publication number 20230230799
    • Publication date Jul 20, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yuta IMAI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON GUN AND ELECTRON MICROSCOPE
    • Publication number 20220406558
    • Publication date Dec 22, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hideo MORISHITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20220254597
    • Publication date Aug 11, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yuta IMAI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20220246393
    • Publication date Aug 4, 2022
    • Hitachi High-Tech Corporation
    • Teruo Kohashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20220068593
    • Publication date Mar 3, 2022
    • Hitachi High-Tech Corporation
    • Hideo Morishita
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE AND METHOD FOR ANALYZING SECONDARY ELE...
    • Publication number 20200402762
    • Publication date Dec 24, 2020
    • Hitachi High-Tech Corporation
    • Teruo Kohashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20200251304
    • Publication date Aug 6, 2020
    • Hitachi High-Technologies Corporation
    • Ryo HIRANO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20200219697
    • Publication date Jul 9, 2020
    • Hitachi High-Technologies Corporation
    • Ryo HIRANO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20200090903
    • Publication date Mar 19, 2020
    • Hitachi High-Technologies Corporation
    • Ryo HIRANO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE, IMAGE GENERATION METHOD, OBSERVATION...
    • Publication number 20160329188
    • Publication date Nov 10, 2016
    • Hitachi High-Technologies Corporation
    • Yusuke OMINAMI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE RADIATION DEVICE
    • Publication number 20130026363
    • Publication date Jan 31, 2013
    • Hitachi High-Technologies Corporation
    • Junichi KATANE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE RADIATION DEVICE
    • Publication number 20110291010
    • Publication date Dec 1, 2011
    • Junichi Katane
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20100090109
    • Publication date Apr 15, 2010
    • Michio Hatano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM APPARATUS
    • Publication number 20090322973
    • Publication date Dec 31, 2009
    • Hitachi High-Technologies Corporation
    • Sukehiro ITO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning electron microscope
    • Publication number 20080073534
    • Publication date Mar 27, 2008
    • Hitachi High-Technologies Corporation
    • Junichi Katane
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning Electron Microscope
    • Publication number 20080035843
    • Publication date Feb 14, 2008
    • Michio Hatano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged particle beam apparatus and method for charged particle bea...
    • Publication number 20070284542
    • Publication date Dec 13, 2007
    • Takeshi Ogashiwa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Scanning electron microscope
    • Publication number 20060186337
    • Publication date Aug 24, 2006
    • Michio Hatano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning electron microscope
    • Publication number 20050127294
    • Publication date Jun 16, 2005
    • Hitachi High-Technologies Corporation
    • Junichi Katane
    • H01 - BASIC ELECTRIC ELEMENTS