Junichi Matsuo

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Gas analyzer
- Patent number 11,774,358
- Issue date Oct 3, 2023
- Yokogawa Electric Corporation
- Junichi Matsuo
- G01 - MEASURING TESTING
Information Patent Grant
Gas analysis device
- Patent number 11,181,475
- Issue date Nov 23, 2021
- Yokogawa Electric Corporation
- Junichi Matsuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor probe having a circuit housing fixable at a plurality of rot...
- Patent number 11,162,828
- Issue date Nov 2, 2021
- Yokogawa Electric Corporation
- Takuya Kawashima
- G01 - MEASURING TESTING
Information Patent Grant
Gas analyzer
- Patent number 10,908,082
- Issue date Feb 2, 2021
- Yokogawa Electric Corporation
- Yoshitaka Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzer
- Patent number 10,871,398
- Issue date Dec 22, 2020
- Yokogawa Electric Corporation
- Yoshitaka Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic analysis apparatus
- Patent number 10,859,491
- Issue date Dec 8, 2020
- Yokogawa Electric Corporation
- Kentaro Hazama
- G01 - MEASURING TESTING
Information Patent Grant
Gas analyzer
- Patent number 10,788,420
- Issue date Sep 29, 2020
- Yokogawa Electric Corporation
- Junichi Matsuo
- G01 - MEASURING TESTING
Information Patent Grant
Laser gas analyzer
- Patent number 10,488,337
- Issue date Nov 26, 2019
- Yokogawa Electric Corporation
- Yusaku Umino
- G01 - MEASURING TESTING
Information Patent Grant
Alignment flange mounted optical window for a laser gas analyzer
- Patent number 9,244,003
- Issue date Jan 26, 2016
- Yokogawa Electric Corporation
- Junichi Matsuo
- G01 - MEASURING TESTING
Information Patent Grant
Method for removing oxide film formed on surface of silicon wafer
- Patent number 9,064,809
- Issue date Jun 23, 2015
- Sumco Corporation
- Hiroyuki Matsuyama
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Flexible printed wiring board
- Patent number 6,333,467
- Issue date Dec 25, 2001
- Fuji Photo Film Co., Ltd.
- Junichi Matsuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for determining recording mode of frequency-modulated vid...
- Patent number 5,113,265
- Issue date May 12, 1992
- Fuji Photo Film Co., Ltd.
- Yasuhito Kobayashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
GAS ANALYZER
- Publication number 20220317040
- Publication date Oct 6, 2022
- YOKOGAWA ELECTRIC CORPORATION
- Junichi Matsuo
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYSIS DEVICE
- Publication number 20200225146
- Publication date Jul 16, 2020
- YOKOGAWA ELECTRIC CORPORATION
- Junichi MATSUO
- G01 - MEASURING TESTING
Information Patent Application
LASER GAS ANALYZER
- Publication number 20190346366
- Publication date Nov 14, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Yusaku Umino
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20190331511
- Publication date Oct 31, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Takuya KAWASHIMA
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYZER
- Publication number 20190331595
- Publication date Oct 31, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Junichi MATSUO
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYZER
- Publication number 20190317018
- Publication date Oct 17, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Yoshitaka Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYZER
- Publication number 20190316965
- Publication date Oct 17, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Yoshitaka Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYSIS DEVICE
- Publication number 20190310188
- Publication date Oct 10, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Junichi Matsuo
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYSIS APPARATUS
- Publication number 20190257749
- Publication date Aug 22, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Kentaro Hazama
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REMOVING OXIDE FILM FORMED ON SURFACE OF SILICON WAFER
- Publication number 20130224438
- Publication date Aug 29, 2013
- SUMCO CORPORATION
- Hiroyuki MATSUYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Infrared gas analyzer
- Publication number 20070046925
- Publication date Mar 1, 2007
- YOKOGAWA ELECTRIC CORPORATION
- Hideaki Yamagishi
- G01 - MEASURING TESTING

Junichi Matsuo

Person

Patents Grantslast 30 patents

Gas analyzer

Gas analysis device

Sensor probe having a circuit housing fixable at a plurality of rot...

Gas analyzer

Gas analyzer

Spectroscopic analysis apparatus

Gas analyzer

Laser gas analyzer

Alignment flange mounted optical window for a laser gas analyzer

Method for removing oxide film formed on surface of silicon wafer

Flexible printed wiring board

Apparatus for determining recording mode of frequency-modulated vid...

Patents Applicationslast 30 patents

GAS ANALYZER

GAS ANALYSIS DEVICE

LASER GAS ANALYZER

MEASUREMENT APPARATUS

GAS ANALYZER

GAS ANALYZER

GAS ANALYZER

GAS ANALYSIS DEVICE

SPECTROSCOPIC ANALYSIS APPARATUS

METHOD FOR REMOVING OXIDE FILM FORMED ON SURFACE OF SILICON WAFER

Infrared gas analyzer