Junichi Nishimoto

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit incorporating test configuration a...
- Patent number 7,702,979
- Issue date Apr 20, 2010
- Semiconductor Technology Academic Research Center
- Masayuki Arai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit incorporating test configuration a...
- Publication number 20060282730
- Publication date Dec 14, 2006
- Semiconductor Technology Academic Research Center
- Masayuki Arai
- G01 - MEASURING TESTING