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Junichi Oizumi

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  • Kasumigaura, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sample handling system
    • Patent number 10,386,380
    • Issue date Aug 20, 2019
    • Hitachi High-Technologies Corporation
    • Kuniaki Onizawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method of evaporation control of a sample stored in a cold container
    • Patent number 9,863,969
    • Issue date Jan 9, 2018
    • Hitachi High-Technologies Corporation
    • Kuniaki Onizawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample handling system
    • Patent number 9,097,691
    • Issue date Aug 4, 2015
    • Hitachi High-Technologies Corporation
    • Kuniaki Onizawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Dispensing nozzle tip
    • Patent number 8,293,192
    • Issue date Oct 23, 2012
    • Hitachi High-Technologies Corporation
    • Ichiro Sakai
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Sample dispensing apparatus and method
    • Patent number 8,221,702
    • Issue date Jul 17, 2012
    • Hitachi High-Technologies Corporation
    • Akihiro Shimoda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample dispensing apparatus
    • Patent number 7,823,469
    • Issue date Nov 2, 2010
    • Hitachi High-Technologies Corporation
    • Eiji Takaya
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SAMPLE HANDLING SYSTEM
    • Publication number 20190331704
    • Publication date Oct 31, 2019
    • Hitachi High-Technologies Corporation
    • Kuniaki ONIZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE HANDLING SYSTEM
    • Publication number 20180095101
    • Publication date Apr 5, 2018
    • Hitachi High-Technologies Corporation
    • Kuniaki ONIZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE HANDLING SYSTEM
    • Publication number 20150285828
    • Publication date Oct 8, 2015
    • Hitachi High-Technologies Corporation
    • Kuniaki ONIZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE DISPENSING APPARATUS AND METHOD
    • Publication number 20080317639
    • Publication date Dec 25, 2008
    • Akihiro SHIMODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE HANDLING SYSTEM
    • Publication number 20080286162
    • Publication date Nov 20, 2008
    • Kuniaki ONIZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE DISPENSING APPARATUS
    • Publication number 20080156118
    • Publication date Jul 3, 2008
    • Eiji TAKAYA
    • G01 - MEASURING TESTING