Junichi Tomizawa

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Ohmura-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Imaging device, semiconductor manufacturing apparatus, and semicond...
- Patent number 9,250,196
- Issue date Feb 2, 2016
- Epicrew Corporation
- Akira Okabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Imaging Device, Semiconductor Manufacturing Apparatus, and Semicond...
- Publication number 20140220712
- Publication date Aug 7, 2014
- Akira Okabe
- G01 - MEASURING TESTING