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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Scattered light measuring device
Patent number
7,907,285
Issue date
Mar 15, 2011
Advantest Corporation
Junichi Ukita
G01 - MEASURING TESTING
Information
Patent Grant
Distortion measuring device, method, program, and recording medium
Patent number
7,397,544
Issue date
Jul 8, 2008
Advantest Corporation
Junichi Ukita
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength dispersion probing system
Patent number
7,020,360
Issue date
Mar 28, 2006
Advantest Corporation
Hiroaki Satomura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DISTORTION MEASURING APPARATUS, METHOD, PROGRAM, AND RECORDING MEDIUM
Publication number
20070171401
Publication date
Jul 26, 2007
Advantest Corporation
Junichi UKITA
G01 - MEASURING TESTING
Information
Patent Application
DISTORTION MEASURING DEVICE, METHOD, PROGRAM, AND RECORDING MEDIUM
Publication number
20070159621
Publication date
Jul 12, 2007
Advantest Corporation
Junichi UKITA
G01 - MEASURING TESTING
Information
Patent Application
Wavelength dispersion probing system
Publication number
20050094936
Publication date
May 5, 2005
Hiroaki Satomura
G01 - MEASURING TESTING