Junichiro Iba

Person

Mohigan Lake, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and semiconductor device manufacturing method
- Patent number 6,600,189
- Issue date Jul 29, 2003
- Kabushiki Kaisha Toshiba
- Tsutomu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor memory device having a tren...
- Patent number 6,534,814
- Issue date Mar 18, 2003
- Kabushiki Kaisha Toshiba
- Junichiro Iba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Planarization method and system using variable exposure
- Patent number 6,440,644
- Issue date Aug 27, 2002
- Kabushiki Kaisha Toshiba
- Takashi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wiring layer of a semiconductor integrated circuit
- Patent number 6,313,535
- Issue date Nov 6, 2001
- Kabushiki Kaisha Toshiba
- Junichiro Iba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of electrical measurement of misregistration of patterns
- Patent number 6,288,556
- Issue date Sep 11, 2001
- Kabushiki Kaisha Toshiba
- Takashi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of making a semiconductor memory device having a buried plat...
- Patent number 6,107,135
- Issue date Aug 22, 2000
- Kabushiki Kaisha Toshiba
- Richard L. Kleinhenz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor memory device having a tren...
- Patent number 6,100,130
- Issue date Aug 8, 2000
- Kabushiki Kaisha Toshiba
- Junichiro Iba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of deforming a trench by a thermal treatment
- Patent number 6,100,132
- Issue date Aug 8, 2000
- Kabushiki Kaisha Toshiba
- Tsutomu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Planarization method and system using variable exposure
- Patent number 6,064,466
- Issue date May 16, 2000
- Kabushiki Kaisha Toshiba
- Takashi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of measuring aberration of projection optics
- Patent number 6,011,611
- Issue date Jan 4, 2000
- Kabushiki Kaisha Toshiba
- Hiroshi Nomura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for making a semiconductor device using a flowable oxide film
- Patent number 5,883,006
- Issue date Mar 16, 1999
- Kabushiki Kaisha Toshiba
- Junichiro Iba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Illumination aperture of low intensity loss
- Patent number 5,715,040
- Issue date Feb 3, 1998
- Kabushiki Kaisha Toshiba
- Junichiro Iba
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
A SEMICONDUCTOR MEMORY DEVICE HAVING A TRENCH CAPACITOR
- Publication number 20020072183
- Publication date Jun 13, 2002
- Junichiro Iba
- H01 - BASIC ELECTRIC ELEMENTS

Junichiro Iba

Person

Patents Grantslast 30 patents

Semiconductor device and semiconductor device manufacturing method

Method of manufacturing a semiconductor memory device having a tren...

Planarization method and system using variable exposure

Wiring layer of a semiconductor integrated circuit

Method of electrical measurement of misregistration of patterns

Method of making a semiconductor memory device having a buried plat...

Method of manufacturing a semiconductor memory device having a tren...

Method of deforming a trench by a thermal treatment

Planarization method and system using variable exposure

Method of measuring aberration of projection optics

Method for making a semiconductor device using a flowable oxide film

Illumination aperture of low intensity loss

Patents Applicationslast 30 patents

A SEMICONDUCTOR MEMORY DEVICE HAVING A TRENCH CAPACITOR