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Junichiro MATAGA
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Fluid leakage diagnosing device, fluid leakage diagnosing system, f...
Patent number
11,703,189
Issue date
Jul 18, 2023
NEC Corporation
Hirofumi Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Leakage inspection device, leakage inspection method, and storage m...
Patent number
11,402,290
Issue date
Aug 2, 2022
NEC Corporation
Shigeki Shinoda
G01 - MEASURING TESTING
Information
Patent Grant
Sound source position detection device, sound source position detec...
Patent number
10,845,460
Issue date
Nov 24, 2020
NEC Corporation
Hirofumi Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic device, diagnostic system, diagnostic method, and comput...
Patent number
10,823,705
Issue date
Nov 3, 2020
NEC Corporation
Shin Tominaga
G01 - MEASURING TESTING
Information
Patent Grant
Position determination device, leak detection system, position dete...
Patent number
10,458,878
Issue date
Oct 29, 2019
NEC Corporation
Hirofumi Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Position determination device, position determination system, posit...
Patent number
10,156,493
Issue date
Dec 18, 2018
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Grant
Leak inspection device, leak inspection method, and leak inspection...
Patent number
9,970,840
Issue date
May 15, 2018
NEC Corporation
Shigeki Shinoda
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Grant
Sensor device, vibration detection system, sensor unit, information...
Patent number
9,921,097
Issue date
Mar 20, 2018
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Grant
Sensor unit
Patent number
9,709,488
Issue date
Jul 18, 2017
NEC Corporation
Shin Tominaga
G02 - OPTICS
Information
Patent Grant
Actuator, piezoelectric actuator, electronic device, and method for...
Patent number
9,137,608
Issue date
Sep 15, 2015
NEC Corporation
Masatake Takahashi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Infrared ray sensor, infrared ray detection device, and electronic...
Patent number
8,921,791
Issue date
Dec 30, 2014
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FLUID LEAKAGE DIAGNOSING DEVICE, FLUID LEAKAGE DIAGNOSING SYSTEM, F...
Publication number
20210325005
Publication date
Oct 21, 2021
NEC Corporation
Hirofumi INOUE
G01 - MEASURING TESTING
Information
Patent Application
FLUID LEAKAGE DIAGNOSIS DEVICE, FLUID LEAKAGE DIAGNOSIS SYSTEM, FLU...
Publication number
20210262886
Publication date
Aug 26, 2021
NEC Corporation
Junichiro MATAGA
G01 - MEASURING TESTING
Information
Patent Application
LEAKAGE INSPECTION DEVICE, LEAKAGE INSPECTION METHOD, AND STORAGE M...
Publication number
20210116323
Publication date
Apr 22, 2021
NEC Corporation
Shigeki SHINODA
G01 - MEASURING TESTING
Information
Patent Application
MODEL GENERATION DEVICE FOR LIFE PREDICTION, MODEL GENERATION METHO...
Publication number
20210048811
Publication date
Feb 18, 2021
NEC Corporation
Soichiro TAKATA
G05 - CONTROLLING REGULATING
Information
Patent Application
SOUND SOURCE POSITION DETECTION DEVICE, SOUND SOURCE POSITION DETEC...
Publication number
20180164403
Publication date
Jun 14, 2018
NEC Corporation
Hirofumi INOUE
G01 - MEASURING TESTING
Information
Patent Application
POSITION DETERMINATION DEVICE, POSITION DETERMINATION SYSTEM, POSIT...
Publication number
20170322104
Publication date
Nov 9, 2017
NEC Corporation
Junichiro MATAGA
G01 - MEASURING TESTING
Information
Patent Application
DIAGNOSTIC DEVICE, DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND COMPUT...
Publication number
20170205376
Publication date
Jul 20, 2017
NEC Corporation
Shin TOMINAGA
G01 - MEASURING TESTING
Information
Patent Application
POSITION DETERMINATION DEVICE, LEAK DETECTION SYSTEM, POSITION DETE...
Publication number
20170102286
Publication date
Apr 13, 2017
NEC Corporation
Hirofumi INOUE
G01 - MEASURING TESTING
Information
Patent Application
SENSOR UNIT
Publication number
20160216203
Publication date
Jul 28, 2016
NEC Corporation
Shin TOMINAGA
G01 - MEASURING TESTING
Information
Patent Application
LEAK INSPECTION DEVICE, LEAK INSPECTION METHOD, AND LEAK INSPECTION...
Publication number
20150253216
Publication date
Sep 10, 2015
NEC Corporation
Shigeki Shinoda
G01 - MEASURING TESTING
Information
Patent Application
VIBRATION SENSOR UNIT
Publication number
20150236610
Publication date
Aug 20, 2015
NEC Corporation
Yasuhiro Sasaki
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE, VIBRATION DETECTION SYSTEM, SENSOR UNIT, INFORMATION...
Publication number
20150226604
Publication date
Aug 13, 2015
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Application
INFRARED DETECTION DEVICE AND INFRARED DETECTION METHOD
Publication number
20150204726
Publication date
Jul 23, 2015
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Application
INFRARED DETECTION SENSOR ARRAY AND INFRARED DETECTION DEVICE
Publication number
20130320213
Publication date
Dec 5, 2013
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Application
ACTUATOR, PIEZOELECTRIC ACTUATOR, ELECTRONIC DEVICE, AND METHOD FOR...
Publication number
20130043766
Publication date
Feb 21, 2013
NEC Corporation
Masatake Takahashi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
INFRARED RAY SENSOR, INFRARED RAY DETECTION DEVICE, AND ELECTRONIC...
Publication number
20120312988
Publication date
Dec 13, 2012
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING