Junji Hazama

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting the pattern on a photographic mask
- Patent number 4,718,767
- Issue date Jan 12, 1988
- Nippon Kogaku K.K.
- Junji Hazama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Small gap measuring apparatus
- Patent number 4,685,805
- Issue date Aug 11, 1987
- Nippon Kogaku K.K.
- Kenichi Kodama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for aligning mask and wafer used in semiconductor circuit...
- Patent number 4,636,626
- Issue date Jan 13, 1987
- Nippon Kogaku K.K.
- Junji Hazama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for detecting defects in pattern
- Patent number 4,589,139
- Issue date May 13, 1986
- Nippon Kogaku K.K.
- Kazunari Hada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for the attitude control of plate-form body
- Patent number 4,537,501
- Issue date Aug 27, 1985
- Nippon Kogaku K.K.
- Yukio Kakizaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for detecting two-dimensional pattern and method for tran...
- Patent number 4,506,382
- Issue date Mar 19, 1985
- Nippon Kogaku K.K.
- Kazunari Hada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for detecting the defect of pattern
- Patent number 4,479,145
- Issue date Oct 23, 1984
- Nippon Kogaku K.K.
- Toru Azuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern testing apparatus
- Patent number 4,472,738
- Issue date Sep 18, 1984
- Nippon Kogaku K.K.
- Kazunari Hada
- G06 - COMPUTING CALCULATING COUNTING

Junji Hazama

Person

Patents Grantslast 30 patents

Method of inspecting the pattern on a photographic mask

Small gap measuring apparatus

Apparatus for aligning mask and wafer used in semiconductor circuit...

Apparatus for detecting defects in pattern

Apparatus for the attitude control of plate-form body

Apparatus for detecting two-dimensional pattern and method for tran...

Apparatus for detecting the defect of pattern

Pattern testing apparatus