Junji Ikeda

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged-particle-beam mapping projection-optical systems and method...
- Patent number 7,183,562
- Issue date Feb 27, 2007
- Nikon Corporation
- Hiroshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle-beam mapping projection-optical systems and method...
- Patent number 7,064,339
- Issue date Jun 20, 2006
- Nikon Corporation
- Hiroshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle-beam mapping projection-optical systems and method...
- Patent number 6,765,217
- Issue date Jul 20, 2004
- Nikon Corporation
- Hiroshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting an optical information and scanning microscope...
- Patent number 5,617,500
- Issue date Apr 1, 1997
- Nikon Corporation
- Takashi Shionoya
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
STORAGE CONTROL DEVICE AND STORAGE SYSTEM
- Publication number 20160291899
- Publication date Oct 6, 2016
- Fujitsu Limited
- Tatsushi TAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL ATTENUATOR PLATE, EXPOSURE APPARATUS, EXPOSURE METHOD, AND...
- Publication number 20090239178
- Publication date Sep 24, 2009
- NIKON CORPORATION
- Junji Ikeda
- G02 - OPTICS
Information Patent Application
Charged-particle-beam mapping projection-optical systems and method...
- Publication number 20060192120
- Publication date Aug 31, 2006
- NIKON CORPORATION
- Hiroshi Nishimura
- G01 - MEASURING TESTING
Information Patent Application
Charged-particle-beam mapping projection-optical systems and method...
- Publication number 20040251428
- Publication date Dec 16, 2004
- NIKON CORPORATION
- Hiroshi Nishimura
- G01 - MEASURING TESTING