Junji Nishiura

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Gyoda, JP

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Patents Grantslast 30 patents

Information Patent Grant
IC test apparatus
- Patent number 5,241,264
- Issue date Aug 31, 1993
- Advantest Corporation
- Junji Nishiura
- G01 - MEASURING TESTING
Information Patent Grant
Memory tester
- Patent number 5,062,109
- Issue date Oct 29, 1991
- Advantest Corporation
- Hiromi Ohshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory test system
- Patent number 4,835,774
- Issue date May 30, 1989
- Advantest Corporation
- Hiromi Ooshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Counter-address memory for multi-channel timing signals
- Patent number 4,553,100
- Issue date Nov 12, 1985
- Takeda Riken Co., Ltd.
- Junji Nishiura
- G11 - INFORMATION STORAGE
Information Patent Grant
Logic test system permitting test pattern changes without dummy cycles
- Patent number 4,313,200
- Issue date Jan 26, 1982
- Takeda Riken Kogyo Kabushikikaisha
- Junji Nishiura
- G01 - MEASURING TESTING